Determination of the effective dominant electron and hole trap in neutron-irradiated silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 516, Issue 1, 2004, Pages 109-115

  Kramberger, G ^a,b   Cindro, V ^a   Mandic I ^a   Mikuz M ^a   Zavrtanik, M ^a  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

^b DESY   (Germany)

Author keywords

Continuous carrier injection; Effective carrier trapping time; Effective space charge; Silicon detectors

Indexed keywords

CARRIER CONCENTRATION; CATHODE RAY OSCILLOSCOPES; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC SPACE CHARGE; ELECTRON TRAPS; HOLE TRAPS; MATHEMATICAL MODELS; NEUTRON IRRADIATION; PROBABILITY; SILICON;

CONTINUOUS CARRIER INJECTION; EFFECTIVE CARRIER TRAPPING TIME; EFFECTIVE SPACE CHARGE; SILICON DETECTORS;

METAL DETECTORS;

EID: 1242330463     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.08.115     Document Type: Article

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