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Advanced Materials

Volumn 16, Issue 23-24, 2004, Pages 2201-2206

Elastomeric molds with tunable microtopography

(4) Huffman, John M a Shao, Jian b Hsu, Chia Hsien b Folch, Albert a

a University of Washington (United States)

b University of Washington (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; ELASTOMERS; LASER BEAMS; OPTICAL PROJECTORS; PHOTOLITHOGRAPHY; POLYMERS; SURFACE TOPOGRAPHY; THICKNESS MEASUREMENT;

GRAYSCALE; MICRODEVICES; MICROTOPOGRAPHY; PHOTORESIST;

MOLDS;

EID: 11344281339 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200400441 Document Type: Article

Times cited : (25)

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