A resonant slit-type probe for millimeter-wave scanning near-field microscopy

IEICE Transactions on Electronics

Volumn E87-C, Issue 12, 2004, Pages 2158-2163

  Nozokido, Tatsuo ^a   Ohbayashi, Tomohiro ^a   Bae, Jongsuck ^a   Mizuno, Koji ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Millimeter waves; Rectangular waveguides; Resonant slit type probes; Scanning near field microscopy; Scanning probes

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; MILLIMETER WAVES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PERMITTIVITY; QUARTZ; RECTANGULAR WAVEGUIDES;

RADIO FREQUENCY; RESONANT SLIT-TYPE PROBES; SCANNING PROBES;

MILLIMETER WAVE DEVICES;

EID: 11144334188     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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