Characterization and Deblurring of Lateral Crosstalk in CMOS Image Sensors

IEEE Transactions on Electron Devices

Volumn 50, Issue 12, 2003, Pages 2361-2368

  Lee, Ji Soo ^a   Shah, Joey ^a   Jernigan, M Ed ^b   Hornsey, Richard I ^c  

^a Micron Imaging   (United States)

^b UNIVERSITY OF WATERLOO   (Canada)

^c YORK UNIVERSITY   (Canada)

Author keywords

Active pixel sensor; CMOS image sensor; Edge effect; Lateral crosstalk; Lateral diffusion; Lateral photoresponse; Modulation transfer function (MTF); Point spread function (PSF)

Indexed keywords

CHARACTERIZATION; CMOS INTEGRATED CIRCUITS; CROSSTALK; IMAGE ANALYSIS; LASER APPLICATIONS; OPTICAL TRANSFER FUNCTION; PHOTODIODES; SPURIOUS SIGNAL NOISE;

ACTIVE PIXEL SENSORS; DEBLURRING; EDGE EFFECTS; HIGH-FREQUENCY NOISE AMPLIFICATION; INTENSITY CLIPPING EFFECTS; LATERAL PHOTORESPONSE; MODULATION TRANSFER FUNCTION (MTF); POINT SPREAD FUNCTION (PSF);

IMAGE SENSORS;

EID: 0347338003     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.819246     Document Type: Article

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