3-D optical and electrical simulation for CMOS image sensors

IEEE Transactions on Electron Devices

Volumn 50, Issue 1, 2003, Pages 19-25

  Mutoh, Hideki ^a  

^a Link Research Corporation   (Japan)

Author keywords

Charge voltage conversion; CMOS image sensor; Crosstalk; Image lag; Readout; Reset; Saturation; Sensitivity; Simulation

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CROSSTALK; ELECTRIC PROPERTIES; OPTICAL PROPERTIES; PHOTODIODES; RAY TRACING; READOUT SYSTEMS; THERMAL DIFFUSION;

CHARGE-VOLTAGE CONVERSION; CMOS IMAGE SENSORS; IMAGE LAG; RESET;

IMAGE SENSORS;

EID: 0037246423     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.806965     Document Type: Article

References (10)

1. E. R. Fossum, "CMOS image sensors: electronic camera on a chip," IEEE Trans. Electron Devices, vol. 44, pp. 1689-1698, Oct. 1997.
2. H. Wong, "Technology and device scaling considerations for CMOS imagers," IEEE Trans. Electron Devices, vol. 43, pp. 2131-2142, Dec. 1996.
3. I. Inoue, H. Nozaki, H. Yamashita, T. Yamaguchi, H. Ishiwata, H. Ihara, R. Miyagawa, H. Miura, N. Nakamura, Y. Egawa, and Y. Matsunaga, "New LV-BPD (low voltage buried photo-diode) for CMOS image sensor," in IEDM Tech. Dig., Dec. 1999, pp. 883-886.
4. K. Yonemoto and H. Sumi, "A CMOS image sensor with a simple fixed-pattern-noise-reduction technology and a hole accumulation diode," IEEE J. Solid-State Circuits, vol. 35, pp. 2038-2043, Dec. 2000.
5. M. Furumiya, H. Ohkubo, Y. Muramatsu, S. Kurosawa, F. Okamoto, Y. Fujimoto, and Y. Nakashiba, "High-sensitivity and no-crosstalk pixel technology for embedded CMOS image sensor," IEEE Trans. Electron Devices, vol. 48, pp. 2221-2227, Oct. 2001.
6. S. Inoue, K. Sakurai, I. Ueno, T. Koizumi, H. Hiyama, T. Asada, S. Sugawa, A. Maeda, K. Higashitani, H. Kato, K. Iizuka, and M. Yamawaki, "A 3.25 M-pixel APS-C size CMOS image sensor," ITEJ Tech. Rep. Jpn., vol. 25, no. 28, pp. 37-41, Mar. 2001.
7. H. Mutoh, "Simulation for 3-dimensional optical and electrical analysis of CCD," IEEE Trans. Electron Devices, vol. 44, pp. 1604-1610, Oct. 1997.
8. I. Shcherback and O. Yadid-Pecht, "CMOS APS MTF modeling," IEEE Trans. Electron Devices, vol. 48, pp. 2710-2715, Dec. 2001.
9. S. M. Sze, Physics of Semiconductor Devices, 2nd ed. New York: Wiley, 1981, ch. 5.4.2.
10. H. Mutoh, Optical simulation for image sensors by wave analysis. presented at 1999 IEEE Workshop on CCDs and Advanced Image Sensors