Integrating logical and physical analysis capabilities for diagnostics

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

Volumn , Issue , 2004, Pages 521-526

  Bartenstein, Thomas ^a   Koenemann, Bernd ^a   Todd, Lee ^a   Vallerie, Lisa ^a  

^a CADENCE DESIGN SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; CONFORMAL MAPPING; DATABASE SYSTEMS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; FEEDBACK; LOGIC PROGRAMMING; MATHEMATICAL MODELS; NANOTECHNOLOGY; PROGRAM DEBUGGING;

ELECTRONIC DESIGN AUTOMATION (EDA); FILE FORMATS; INTEGRATED DEVICE MANUFACTURERS (IDM); LOGIC BITMAPPING;

COMPUTER AIDED DIAGNOSIS;

EID: 10444288968     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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