Timing characterization of Multiple Timing Domains

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 663-666

  Weger, Alan J ^a   McManus, Moyra ^a   Song, Peilin ^a   Muszynski, Andy ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; ELECTRIC POWER SUPPLIES TO APPARATUS; INFRARED RADIATION; LIGHT EMISSION; OSCILLATORS (ELECTRONIC); PROBLEM SOLVING; SPURIOUS SIGNAL NOISE; TRANSISTORS; WAVEFORM ANALYSIS;

LIGHT INTENSITY; SWITCHING ACTIVITIES; TIME SHIFT;

ELECTRIC NETWORK ANALYSIS;

EID: 1542270260     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M.K. Mc Manus, P. Sanda, S. Steen, D. Knebel, D. Manzer, S. Polonsky, W. Huott, S. Wilson, T. Pellela, Y. Chan, Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache, Proceedings from the 25th International Symposium for Testing and Failure Analysis, 1999, p. 35
2. T.M. Eiles, K.R. Wilsher, W.K. Lo, G. Xiao, "Optical interferometric probing of advanced microprocessors", Proceedings of International Test Conference, 2001, p. 80.
3. J.C. Tsang, J.A. Kash and D.P. Vallett, "Time-resolved optical characterization of electrical activity in integrated circuits", IEEE Proceedings, vol. 88, no. 9, 2000, p. 1440.