Defect-based testing for fabless companies

Proceedings - 2000 IEEE International Workshop on Defect Based Testing

Volumn , Issue , 2000, Pages 23-29

  Khare, J ^a   Heubeken, H T ^a  

^a Level One Communications   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETER EXTRACTION;

DEFECT STATISTICS; DEFECT-BASED TESTING; FABLESS COMPANIES; FABLESS SEMICONDUCTOR COMPANIES; PROFIT MARGIN;

DEFECTS;

EID: 84961878103     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DBT.2000.843686     Document Type: Conference Paper

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