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Volumn 45, Issue 3-4, 2004, Pages 239-274

The magnetic resonance force microscope

Author keywords

Buried interfaces; Magnetic resonance force microscopy; Nanomagnetism; Nondemohshing qiuntmn measurements; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROMAGNETIC RESONANCE; FOURIER TRANSFORMS; MAGNETIC RESONANCE IMAGING; RESONATORS; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; SQUIDS; THEOREM PROVING;

EID: 10044262294     PISSN: 00796565     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pnmrs.2004.06.001     Document Type: Review
Times cited : (29)

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