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Journal of Applied Physics

Volumn 80, Issue 12, 1996, Pages 6931-6938

Sensitivity and spatial resolution for electron-spin-resonance detection by magnetic resonance force microscopy

(3) Zhang, Z a,c Roukes, M L b Hammel, P C a

a LOS ALAMOS NATIONAL LABORATORY (United States)

b CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

c CENTER FOR NONLINEAR STUDIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTROMAGNETS; FOURIER TRANSFORMS; INTERFEROMETERS; MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIC PERMEABILITY; MAGNETIC RESONANCE; MAGNETIZATION; MICROSCOPIC EXAMINATION; MODULATION; OSCILLATIONS;

BAR MAGNET; BLOCH EQUATION; LOCK IN AMPLIFIER; MAGNETIC RESONANCE FORCE MICROSCOPY; OPTICAL FIBER INTERFEROMETER; SOLENOID MAGNET; UNIFORM RESONANCE LINEWIDTH;

PARAMAGNETIC RESONANCE;

EID: 0030412231 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.363767 Document Type: Article

Times cited : (20)

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