Imaging mechanisms of force detected FMR microscopy

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6493-6495

  Midzor, M M ^a   Wigen, P E ^b   Pelekhov, D ^c   Chen, W ^a   Hammel, P C ^c   Roukes, M L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b OHIO STATE UNIVERSITY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001646535     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372748     Document Type: Article

References (8)

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3. SC12 Contact Ultrasharp silicon cantilevers, ND-MDT, P.O. Box 50 103305 Moscow, Russia.
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5. P. E. Wigen, Thin Solid Films 114, 135 (1984).
6. R. W. Damon and J. R. Eshbach, J. Phys. Chem. Solids 19, 308 (1961).
7. B. E. Storey, A. O. Tooke, A. P. Cracknell, and J. A. Przystawa, J. Phys. C 10, 875 (1997).
8. This is obtained from the Near Fundamental Resonance approximation; M. J. Hurben and C. E. Patton, J. Magn. Magn. Mater. 139, 263 (1995).