Magnetic resonance force detection and spectroscopy of electron spins in phosphorus-doped silicon

Review of Scientific Instruments

Volumn 68, Issue 4, 1997, Pages 1823-1826

  Wago, K ^a,d   Zuger O ^b,d   Wegener, J ^c,d   Kendrick, R ^d   Yannoni, C S ^d   Rugar, D ^d  

^a STANFORD UNIVERSITY   (United States)

^b Balzers Thin Films   (Liechtenstein)

^c TU DORTMUND UNIVERSITY   (Germany)

^d IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; ELECTRONS; MAGNETIZATION; MICROSCOPIC EXAMINATION; PHOSPHORUS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

ELECTRON SPINS; HYPERFINE SPLITTING; MAGNETIC RESONANCE FORCE MICROSCOPY;

ELECTRON SPIN RESONANCE SPECTROSCOPY;

EID: 0031119358     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147967     Document Type: Article

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