Low-temperature magnetic resonance force detection

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1197-1201

  Wago, K ^a,b   Zuger O ^a   Kendrick, R ^a   Yannoni, C S ^a   Rugar, D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544251187     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588513     Document Type: Article

References (15)

1. J. A. Sidles, Appl. Phys. Lett. 58, 2854 (1991).
2. J. A. Sidles, Phys. Rev. Lett. 68, 1124 (1992).
3. D. Rugar, C. S. Yannoni, and J. A. Sidles, Nature 360, 563 (1992).
4. O. Züger and D. Rugar, Appl. Phys. Lett. 63, 2496 (1993).
5. O. Züger and D. Rugar, J. Appl. Phys. 75, 6211 (1994).
6. D. Rugar, O. Züger, S. Hoen, C. S. Yannoni, H. M. Vieth, and R. D. Kendrick, Science 264, 1560 (1994).
7. J. A. Sidles, J. L. Garbini, and G. P. Drobny, Rev. Sci. Instrum. 63, 3881 (1992).
8. U. Durig, O. Züger, and A. Stalder, J. Appl. Phys. 72, 1778 (1992).
9. J. A. Sidles and D. Rugar, Phys. Rev. Lett. 70, 3506 (1993).
10. T. R. Albrecht, P. Grütter, D. Rugar, and D. P. E. Smith, Ultramicroscopy 42-44, 1638 (1992).
11. Model ESP(W), Digital Instruments Inc., Santa Barbara, CA.
12. D. Rugar, H. J. Mamin, and P. Guethner, Appl. Phys. Lett. 55, 2588 (1989).
13. c is the inverse of the equivalent noise bandwidth of the cantilever resonance.
14. J. Mertz, O. Marti, and J. Mlynek, Appl. Phys. Lett. 62, 2344 (1993).
15. O. Züger, S. Hoen, H. M. Vieth, C. S. Yannoni, and D. Rugar (in preparation).