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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 2275-2279

Ferromagnetic resonance imaging of Co films using magnetic resonance force microscopy

(6) Suh, B J a Hammel, P C a Zhang, Z a Midzor, M M b Roukes, M L b Childress, J R c

a LOS ALAMOS NATIONAL LABORATORY (United States)

b CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

c UNIVERSITY OF FLORIDA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009655455 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.590161 Document Type: Article

Times cited : (13)

References (16)

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- note
- Digital Instruments, 520 E. Montecito St, Santa Barbara, CA. The experiments reported here use type ESP cantilevers which are 450 μm long, 30-40 μm wide and 1-3 μm thick.

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