메뉴 건너뛰기




Volumn 11, Issue 2, 2003, Pages 99-111

HgCdTe epilayers on GaAs: Growth and devices

Author keywords

Ellipsometer; Focal plane arrays; Growth GaAs; Heterostructures; Infrared detectors; MBE; MCT; P n junctions; Photoconductors; Photodiodes; Si

Indexed keywords

ANNEALING; COMPOSITION; DISLOCATIONS (CRYSTALS); ELLIPSOMETRY; HETEROJUNCTIONS; INFRARED DETECTORS; MERCURY COMPOUNDS; MOLECULAR BEAM EPITAXY; PHOTODIODES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SOLID SOLUTIONS; SUBSTRATES; ULTRAHIGH VACUUM;

EID: 0346335579     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (80)

References (36)
  • 2
    • 0028463995 scopus 로고
    • High-resolution photoluminescence studies of (211) CdTe grown on (211) GaAs substrate
    • S.D. Chen, L. Lin, X.Z. He, Z.Y. Xu, C.P. Luo, and J.Z. Xu, "High-resolution photoluminescence studies of (211) CdTe grown on (211) GaAs substrate", J. Cryst. Growth 140, 287 (1994).
    • (1994) J. Cryst. Growth , vol.140 , pp. 287
    • Chen, S.D.1    Lin, L.2    He, X.Z.3    Xu, Z.Y.4    Luo, C.P.5    Xu, J.Z.6
  • 4
    • 0035399117 scopus 로고    scopus 로고
    • High-quality CdTe growth in the (100)-orientation on (100) GaAs substrate by molecular beam epitaxy
    • K. Kokie, T. Tanaka, S. Li, and M. Yano, "High-quality CdTe growth in the (100)-orientation on (100) GaAs substrate by molecular beam epitaxy", J. Cryst. Growth 227-228, 671 (2001).
    • (2001) J. Cryst. Growth , vol.227-228 , pp. 671
    • Kokie, K.1    Tanaka, T.2    Li, S.3    Yano, M.4
  • 5
    • 36449005209 scopus 로고
    • Molecular-beam epitaxial growth of CdTe(112) on Si(112) substrates
    • T.J. de Lyon, D. Rajavel, S.M. Johnson, and C.A. Cockrum, "Molecular-beam epitaxial growth of CdTe(112) on Si(112) substrates", Appl. Phys. Lett. 66, 2129 (1995).
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2129
    • De Lyon, T.J.1    Rajavel, D.2    Johnson, S.M.3    Cockrum, C.A.4
  • 6
    • 0042581922 scopus 로고    scopus 로고
    • HgCdTe and CdTe(113)B growth on Si(112)5° off by molecular beam epitaxy
    • M. Kawano, A. Ajisawa, N. Oda, M. Nagashima, and H. Wada, "HgCdTe and CdTe(113)B growth on Si(112)5° off by molecular beam epitaxy", Appl. Phys. Lett. 69, 2876 (1996).
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2876
    • Kawano, M.1    Ajisawa, A.2    Oda, N.3    Nagashima, M.4    Wada, H.5
  • 13
  • 14
    • 0342955059 scopus 로고    scopus 로고
    • Effect of dislocations on performance of LWIR HgCdTe photodiodes
    • K. Jóźwikowski, and A. Rogalski, "Effect of dislocations on performance of LWIR HgCdTe photodiodes", J. Electron. Mater. 29, 736 (2000).
    • (2000) J. Electron. Mater. , vol.29 , pp. 736
    • Jóźwikowski, K.1    Rogalski, A.2
  • 15
    • 0001139936 scopus 로고
    • Dislocation density reduction by thermal annealing of HgCdTe epilayers grown by molecular beam epitaxy on GaAs substrates
    • J.M. Arias, M. Zandian, S.H. Shin, W.V. McLevige, J.G. Pasko, and R.E. DeWames, "Dislocation density reduction by thermal annealing of HgCdTe epilayers grown by molecular beam epitaxy on GaAs substrates", J. Vac. Sci. Technol. B9, 1646 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1646
    • Arias, J.M.1    Zandian, M.2    Shin, S.H.3    McLevige, W.V.4    Pasko, J.G.5    DeWames, R.E.6
  • 19
    • 0002939644 scopus 로고
    • Growth of HgCdTe by molecular beam epitaxy
    • edited by P. Capper, INSPEC, Institution of Electrical Engineers, London, United Kindom
    • J.M. Arias, "Growth of HgCdTe by molecular beam epitaxy" in Properties of Narrow Gap Cadmium-based Compounds, edited by P. Capper, p. 30, INSPEC, Institution of Electrical Engineers, London, United Kindom, 1994.
    • (1994) Properties of Narrow Gap Cadmium-based Compounds , pp. 30
    • Arias, J.M.1
  • 20
    • 0001459889 scopus 로고
    • About possibility of formation of amorphous phase at heterostructure formation with large lattice mismatch
    • in Russian
    • Yu.G. Sidorov and E.M. Trukhanov, "About possibility of formation of amorphous phase at heterostructure formation with large lattice mismatch", Poverhnost N6, 106, (1992). (in Russian).
    • (1992) Poverhnost , vol.N6 , pp. 106
    • Sidorov, Yu.G.1    Trukhanov, E.M.2
  • 21
    • 0042619200 scopus 로고
    • Investigation of initial stage at molecular beam epitaxy of CdTe on GaAs(100)
    • in Russian
    • S.A. Dvoretsky, V.P. Zubkov, V.V. Kalinin, V.D. Kuzmin, and Yu.G. Sidorov, "Investigation of initial stage at molecular beam epitaxy of CdTe on GaAs(100)", Poverhnost N9, 45 (1991). (in Russian).
    • (1991) Poverhnost , vol.N9 , pp. 45
    • Dvoretsky, S.A.1    Zubkov, V.P.2    Kalinin, V.V.3    Kuzmin, V.D.4    Sidorov, Yu.G.5
  • 23
    • 0011925867 scopus 로고    scopus 로고
    • Inventor's certificate RF No. 16314 of 20.12. in Russian
    • E.V. Spesivtsev and S.V. Rykhlitski, "Ellipsometer", Inventor's certificate RF No. 16314 of 20.12.2000. (in Russian)
    • (2000) Ellipsometer
    • Spesivtsev, E.V.1    Rykhlitski, S.V.2
  • 25
    • 33644686119 scopus 로고    scopus 로고
    • Donor defects in HgCdTe epitaxial layers grown by molecular beam epitaxy
    • in Russian
    • V.S. Varavin, S.A. Dvoretsky, N.N. Mikhailov, and Yu.G. Sidorov, "Donor defects in HgCdTe epitaxial layers grown by molecular beam epitaxy", Avtometriya N3, 9 (2001). (in Russian).
    • (2001) Avtometriya , vol.N3 , pp. 9
    • Varavin, V.S.1    Dvoretsky, S.A.2    Mikhailov, N.N.3    Sidorov, Yu.G.4
  • 26
  • 35
    • 0018951248 scopus 로고
    • The Shockley-like equation for the carrier densities and current flow in materials with a nonuniform composition
    • K.M. Van Vlliet and A.H. Marshak, "The Shockley-like equation for the carrier densities and current flow in materials with a nonuniform composition", Solid State Electron. 23, 49 (1980).
    • (1980) Solid State Electron. , vol.23 , pp. 49
    • Van Vlliet, K.M.1    Marshak, A.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.