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Volumn 94, Issue 10, 2003, Pages 6525-6532

Magnetic force gradient mapping

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FORCE GRADIENTS; MAGNETIC FORCE MICROSCOPY (MFM);

EID: 0344515473     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1623926     Document Type: Article
Times cited : (9)

References (41)
  • 20
    • 0344598580 scopus 로고    scopus 로고
    • Imation Corp., St. Paul, MN
    • 1 GB Rewriteable, Imation Corp., St. Paul, MN.
    • 1 GB Rewriteable
  • 21
    • 0344166936 scopus 로고    scopus 로고
    • NanoWorld Services, Wetzlar, Germany
    • NanoWorld Services, Wetzlar, Germany.
  • 25
    • 0345460617 scopus 로고    scopus 로고
    • We assumed that there were no pinned charges as the sample was a fairly good conductor
    • We assumed that there were no pinned charges as the sample was a fairly good conductor.
  • 32
    • 0344166933 scopus 로고    scopus 로고
    • note
    • A stationary cantilever experiencing an static, external force, F, is deflected by δz = F/k. During the noncontact portion of the amplitude curves, the largest force we measured was on the order of 1 nN, which caused a static deflection on the order of 1 nm. Since this deflection was much smaller than the 6.7 nm steps taken in the amplitude curves, we neglected static forces on the cantilever.
  • 41
    • 0345460613 scopus 로고    scopus 로고
    • note
    • It is possible, however, to obtain a better fit when the point dipole tip in the model is arbitrarily positioned much farther from the sample surface than the tip apex.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.