On the determination of the internal magnetic structure by magnetic force microscopy

Journal of Magnetism and Magnetic Materials

Volumn 190, Issue 1-2, 1998, Pages 148-151

  Vellekoop, Bas ^a   Abelmann, Leon ^b   Porthun, Steffen ^b   Lodder, Cock ^b  

^a Tandberg   (Norway)

^b NONE

Author keywords

Fourier analysis; Magnetic force microscopy; Magnetic structure

Indexed keywords

COMPUTATIONAL METHODS; MAGNETIC FIELDS;

MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC VARIABLES MEASUREMENT;

EID: 0032287776     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(98)00280-7     Document Type: Article

References (4)

1. D.K. Cheng, Field and Wave Electromagnetics, Addison-Wesley, Reading, MA, 1989.
2. H.J. Hug, B. Stiefel, P.J.A. van Schendel, A. Moser, R. Hofer, H.-J. Güntherodt, S. Porthun, L. Abelmann, J.C. Lodder, G. Bochi, R.C. O'Handy, J. Appl. Phys. 83 (1998) 5609.
3. J.C. Mallinson, IEEE Trans. Magn.17-5 (1981) 2453.
4. S. Porthum, L. Abelmann, J.C. Lodder, J. Magn. Magn. Mater. 182 (1998) 238.