A Versatile Built-In CMOS Sensing Device for Digital Circuit Parametric Test

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 6, 2003, Pages 1756-1764

  Dragic, Marco S ^a   Margala, Martin ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b University of Rochester   (United States)

Author keywords

Built in self test (BIST); CMOS integrated circuits; Current sensor; I DDQ test; On line test; Parametric test; Power supply monitoring

Indexed keywords

DIGITAL CIRCUITS; ELECTRIC CURRENTS; FREQUENCIES; POWER SUPPLY CIRCUITS; TOPOLOGY; VLSI CIRCUITS;

CURRENT SENSORS; DIGITAL LOGIC; PARAMETRIC TESTS;

CMOS INTEGRATED CIRCUITS;

EID: 0344013021     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.818725     Document Type: Article

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