Current-based testinc for deep-submicron VLSIs

IEEE Design and Test of Computers

Volumn 18, Issue 2, 2001, Pages 76-84

  Sachdev, Manoj ^a,b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b IEEE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POWER SUPPLIES TO APPARATUS; LEAKAGE CURRENTS; MOSFET DEVICES; THRESHOLD VOLTAGE; VLSI CIRCUITS;

CURRENT BASED TESTING; DEEP SUBMICRON TRANSISTOR; DEVICE UNDER TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0035279547     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.914627     Document Type: Article

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