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Volumn 83, Issue 11, 1998, Pages 5992-5996

Structural defects and microstrain in GaN induced by Mg ion implantation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343419620     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367465     Document Type: Article
Times cited : (67)

References (35)
  • 20
    • 33751345775 scopus 로고
    • D. M. Hoffman, et al., Phys. Rev. B 52, 16 702 (1995); A. Hoffman, et al., Solid-State Electron. 41, 275 (1997).
    • (1995) Phys. Rev. B , vol.52 , pp. 16702
    • Hoffman, D.M.1
  • 21
    • 0031075667 scopus 로고    scopus 로고
    • D. M. Hoffman, et al., Phys. Rev. B 52, 16 702 (1995); A. Hoffman, et al., Solid-State Electron. 41, 275 (1997).
    • (1997) Solid-State Electron. , vol.41 , pp. 275
    • Hoffman, A.1
  • 22
    • 0003443049 scopus 로고
    • Dover, New York, Chaps. 1 and 2
    • J. I. Pankove, Optical Processes in Semiconductors (Dover, New York, 1971), Chaps. 1 and 2; J. B. Jeon, B. C. Lee, Yu. M. Sirenko, K. W. Kim, and M. A. Littlejohn, J. Appl. Phys. 82, 386 (1997).
    • (1971) Optical Processes in Semiconductors
    • Pankove, J.I.1
  • 27
    • 85034468302 scopus 로고    scopus 로고
    • J. I. Pankove, in Ref. 20, Chap. 7
    • J. I. Pankove, in Ref. 20, Chap. 7.
  • 29
    • 85034471674 scopus 로고    scopus 로고
    • note
    • -1 in RTA treated Mg ion implanted GaN and undoped GaN samples. The corresponding PL spectra show that the LO phonon replica has an energy of 84±8 meV. This result is close to 91 meV in Ref. 17.


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