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Volumn 377-378, Issue , 2000, Pages 285-289
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Fidelity of diamond replicas on silicon substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
MICROMETERS;
NANOSTRUCTURED MATERIALS;
SILICON;
SUBSTRATES;
SURFACE ROUGHNESS;
WET-ETCHED PROCESS;
DIAMOND FILMS;
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EID: 0343371541
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01332-8 Document Type: Article |
Times cited : (7)
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References (15)
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