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Volumn 377-378, Issue , 2000, Pages 285-289

Fidelity of diamond replicas on silicon substrate

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; MICROMETERS; NANOSTRUCTURED MATERIALS; SILICON; SUBSTRATES; SURFACE ROUGHNESS;

EID: 0343371541     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01332-8     Document Type: Article
Times cited : (7)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.