Interface formation and energy level alignment of pentacene on SiO 2

Journal of Applied Physics

Volumn 94, Issue 9, 2003, Pages 5782-5786

  Watkins, N J ^a,b   Gao, Yongli ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; DEPOSITION; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; SUBSTRATES; SURFACES; THIN FILM TRANSISTORS;

INTERFACE FORMATION;

SILICA;

EID: 0242721136     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1615298     Document Type: Article

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