On Reducing Wrapper Boundary Register Cells in Modular SOC Testing

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 622-631

  Xu, Qiang ^a   Nicolici, Nicola ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL CAPACITY; COMPUTATIONAL COMPLEXITY; EMBEDDED SYSTEMS;

REGISTER CELLS;

MICROPROCESSOR CHIPS;

EID: 0142184788     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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