-
1
-
-
0004181625
-
-
CRC Press, Boca Raton; (ISBN: 0-8493-9451-1)
-
M. Madou, Fundamentals of Microfabrication, CRC Press, Boca Raton, Raton, and references therein, 1997 (ISBN: 0-8493-9451-1).
-
(1997)
Fundamentals of Microfabrication
-
-
Madou, M.1
-
2
-
-
0034711368
-
Nanoelectromechanical systems
-
H.G. Craighead, Nanoelectromechanical systems, Science 290 (2000) 1532-1535.
-
(2000)
Science
, vol.290
, pp. 1532-1535
-
-
Craighead, H.G.1
-
3
-
-
0003817362
-
-
A. van den Berg, W. Olthuis, P. Bergveld (Eds.); Kluwer Academic Publishers, Dordrecht; (ISBN: 0-7923-6387-6)
-
A. van den Berg, W. Olthuis, P. Bergveld (Eds.), Micro Total Analysis Systems 2000, Kluwer Academic Publishers, Dordrecht, and references therein, 2000 (ISBN: 0-7923-6387-6).
-
(2000)
Micro Total Analysis Systems 2000
-
-
-
5
-
-
0033593584
-
Self-oriented regular arrays of carbon nanotubes and their field emission properties
-
S. Fan, M.G. Chapline, N.R. Franklin, T.W. Tombler, A.M. Cassell, H. Dai, Self-oriented regular arrays of carbon nanotubes and their field emission properties, Science 283 (1999) 512-514.
-
(1999)
Science
, vol.283
, pp. 512-514
-
-
Fan, S.1
Chapline, M.G.2
Franklin, N.R.3
Tombler, T.W.4
Cassell, A.M.5
Dai, H.6
-
6
-
-
0034205553
-
Resistless patterning of sub-micron structures by evaporation through nanostencils
-
J. Brugger J.W. Berenschot, S. Kuiper, W. Nijdam, B. Otter, M. Elwenspoek, Resistless patterning of sub-micron structures by evaporation through nanostencils, Microelectron. Eng. 53 (2000) 403-405.
-
(2000)
Microelectron. Eng.
, vol.53
, pp. 403-405
-
-
Brugger, J.1
Berenschot, J.W.2
Kuiper, S.3
Nijdam, W.4
Otter, B.5
Elwenspoek, M.6
-
7
-
-
0345237255
-
Using elastomeric membranes as dry resists and for dry lift-off
-
R.J. Jackman, D.C. Duffy, O. Cherniavskaya, G.M. Whitesides, Using elastomeric membranes as dry resists and for dry lift-off, Langmuir 15 (1999) 2973-2984.
-
(1999)
Langmuir
, vol.15
, pp. 2973-2984
-
-
Jackman, R.J.1
Duffy, D.C.2
Cherniavskaya, O.3
Whitesides, G.M.4
-
8
-
-
0343932624
-
Self-aligned 3D shadow mask technique for patterning deeply recessed surfaces of micro-electro-mechanical systems devices
-
J. Brugger, C. Andreoli, M. Despont, U. Drechsler, H. Rothuizen, P. Vettiger, Self-aligned 3D shadow mask technique for patterning deeply recessed surfaces of micro-electro-mechanical systems devices, Sens. Actuators 76 (1999) 329-334.
-
(1999)
Sens. Actuators
, vol.76
, pp. 329-334
-
-
Brugger, J.1
Andreoli, C.2
Despont, M.3
Drechsler, U.4
Rothuizen, H.5
Vettiger, P.6
-
9
-
-
0142105219
-
-
US Patent no. 6,080,513 (4 May)
-
US Patent no. 6,080,513 (4 May 1998).
-
(1998)
-
-
-
10
-
-
0038798179
-
Micromachining applications of a high resolution ultrathick photoresist
-
K.Y. Lee, N. LaBianca, S.A. Rishton, S. Zolgharnain, J.D. Gelorme, J. Shaw, T.H.P. Chang, Micromachining applications of a high resolution ultrathick photoresist, J. Vac. Sci. Technol. B 13 (1995) 3012-3016.
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 3012-3016
-
-
Lee, K.Y.1
LaBianca, N.2
Rishton, S.A.3
Zolgharnain, S.4
Gelorme, J.D.5
Shaw, J.6
Chang, T.H.P.7
-
11
-
-
0030677606
-
High-aspect-ratio, ultrathick, negative-tone near-UV photoresist for MEMS applications
-
M. Despont, H. Lorenz, N. Fahrni, J. Brugger, P. Renaud, P. Vettiger, High-aspect-ratio, ultrathick, negative-tone near-UV photoresist for MEMS applications, Proc. MEMS 1997 (1997) 518-522.
-
(1997)
Proc. MEMS 1997
, pp. 518-522
-
-
Despont, M.1
Lorenz, H.2
Fahrni, N.3
Brugger, J.4
Renaud, P.5
Vettiger, P.6
-
12
-
-
0031674888
-
High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS
-
H. Lorenz, M. Despont, N. Fahrni, J. Brugger, P. Vettiger, P. Renaud, High-aspect-ratio, ultrathick, negative-tone near-UV photoresist and its applications for MEMS, Sens. Actuators A 64 (1998) 33-39.
-
(1998)
Sens. Actuators A
, vol.64
, pp. 33-39
-
-
Lorenz, H.1
Despont, M.2
Fahrni, N.3
Brugger, J.4
Vettiger, P.5
Renaud, P.6
-
13
-
-
0142073596
-
Reduction of internal stress in a SU-8 like negative tone photoresist for MEMS applications by chemical modification
-
R. Ruhmann, G. Ahrens, A. Schuetz, J. Voskuhl, G. Gruetzner, Reduction of internal stress in a SU-8 like negative tone photoresist for MEMS applications by chemical modification, SPIE Microlithogr. 43 (2001) 45-57.
-
(2001)
SPIE Microlithogr.
, vol.43
, pp. 45-57
-
-
Ruhmann, R.1
Ahrens, G.2
Schuetz, A.3
Voskuhl, J.4
Gruetzner, G.5
-
14
-
-
0035450725
-
A self-assembled monolayer-assisted surface microfabrication and release technique
-
B.J. Kim, M. Liebau, J. Huskens, D.N. Reinhoudt, J. Brugger, A self-assembled monolayer-assisted surface microfabrication and release technique, Microelectron. Eng. 57 (2001) 755-760.
-
(2001)
Microelectron. Eng.
, vol.57
, pp. 755-760
-
-
Kim, B.J.1
Liebau, M.2
Huskens, J.3
Reinhoudt, D.N.4
Brugger, J.5
-
15
-
-
0034155943
-
Residual strain and resultant postrelease deflection of surface micromachined structures
-
T. Hubbard, J. Wylde, Residual strain and resultant postrelease deflection of surface micromachined structures, J. Vac. Sci. Technol. A 18 (2000) 734-737.
-
(2000)
J. Vac. Sci. Technol. A
, vol.18
, pp. 734-737
-
-
Hubbard, T.1
Wylde, J.2
-
16
-
-
0033715606
-
A silicon shadow mask for deposition on isolated areas
-
A. Tixier, Y. Mita, J.P. Gouy, H. Fujita, A silicon shadow mask for deposition on isolated areas, J. Micromech. Microeng. 10 (2000) 157-162.
-
(2000)
J. Micromech. Microeng.
, vol.10
, pp. 157-162
-
-
Tixier, A.1
Mita, Y.2
Gouy, J.P.3
Fujita, H.4
-
18
-
-
21544444472
-
Offset masks for lift-off photoprocessing
-
G.J. Dolan, Offset masks for lift-off photoprocessing, Appl. Phys. Lett. 31 (1977) 337-339.
-
(1977)
Appl. Phys. Lett.
, vol.31
, pp. 337-339
-
-
Dolan, G.J.1
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