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Volumn 70, Issue 2-4, 2003, Pages 489-494

Electroless deposition of novel Ag-W thin films

Author keywords

Electroless deposition; Silver; Thin film; Tungsten

Indexed keywords

ELECTROLESS PLATING; MICROSTRUCTURE; SILICA; SILVER; SUBSTRATES;

EID: 0142106886     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(03)00414-3     Document Type: Conference Paper
Times cited : (16)

References (12)
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    • Formation of aluminum oxynitride diffusion barriers for Ag metallization
    • Wang Y., Alford T.L. Formation of aluminum oxynitride diffusion barriers for Ag metallization. Appl. Phys. Lett. 74(1) (1999) 52-54.
    • (1999) Appl. Phys. Lett. , vol.74 , Issue.1 , pp. 52-54
    • Wang, Y.1    Alford, T.L.2
  • 3
    • 0000179978 scopus 로고    scopus 로고
    • Scaling properties and electromigration resistance of sputtered Ag metallization lines
    • Hauder M., Gstottner J., Hansch W., Schmitt-Landsiedel D. Scaling properties and electromigration resistance of sputtered Ag metallization lines. Appl. Phys. Lett. 78(6) (2001) 838-840.
    • (2001) Appl. Phys. Lett. , vol.78 , Issue.6 , pp. 838-840
    • Hauder, M.1    Gstottner, J.2    Hansch, W.3    Schmitt-Landsiedel, D.4
  • 7
    • 0002001622 scopus 로고    scopus 로고
    • Copper electroless deposition technology for ultra-large-scale-integration (ULSI) metallization
    • Shacham-Diamand Y., Dubin V. Copper electroless deposition technology for ultra-large-scale-integration (ULSI) metallization. Microelectron. Eng. 33(1997) 47-58.
    • (1997) Microelectron. Eng. , vol.33 , pp. 47-58
    • Shacham-Diamand, Y.1    Dubin, V.2
  • 8
    • 0031270393 scopus 로고    scopus 로고
    • High aspect ratio quarter-micron electroless copper integrated technology
    • Shacham-Diamand Y., Lopatin S. High aspect ratio quarter-micron electroless copper integrated technology. Microelectron. Eng. 37/38 (1997) 77-88.
    • (1997) Microelectron. Eng. , vol.37-38 , pp. 77-88
    • Shacham-Diamand, Y.1    Lopatin, S.2
  • 9
    • 0034272509 scopus 로고    scopus 로고
    • Electroless silver and silver with tungsten thin films for microelectronics and microelectromechanical system applications
    • Shacham-Diamand Y., Inberg A., Sverdlov Y., Croitoru N. Electroless silver and silver with tungsten thin films for microelectronics and microelectromechanical system applications. J. Electrochem. Soc. 147(9) (2000) 3345-3349.
    • (2000) J. Electrochem. Soc. , vol.147 , Issue.9 , pp. 3345-3349
    • Shacham-Diamand, Y.1    Inberg, A.2    Sverdlov, Y.3    Croitoru, N.4
  • 10
    • 0037799429 scopus 로고    scopus 로고
    • Novel highly conductive silver-tungsten thin films electroless deposited from benzoate solution for microelectronic applications
    • Inberg A., Bogush V., Croitoru N., Dubin V., Shacham-Diamand Y. Novel highly conductive silver-tungsten thin films electroless deposited from benzoate solution for microelectronic applications. J. Electrochem. Soc. 150(5) (2003) C285-C291.
    • (2003) J. Electrochem. Soc. , vol.150 , Issue.5
    • Inberg, A.1    Bogush, V.2    Croitoru, N.3    Dubin, V.4    Shacham-Diamand, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.