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Volumn 37-38, Issue , 1997, Pages 77-88

High aspect ratio quarter-micron electroless copper integrated technology (Invited lecture)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COPPER; DIFFUSION IN LIQUIDS; ELECTROLESS PLATING; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; METALLIZING; PHASE INTERFACES; REDOX REACTIONS; SILICON WAFERS; THIN FILMS; ULSI CIRCUITS;

EID: 0031270393     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(97)00096-8     Document Type: Article
Times cited : (57)

References (11)
  • 5
    • 20544464569 scopus 로고    scopus 로고
    • Conformal electroless copper deposition for sub-0.5 μm interconnect wiring of very high aspect ratio
    • The Electrochemical Society, San Antonio, Texas
    • S. Lopatin, Y. Shacham-Diamand, V. Dubin, J. Pellerin, B. Zhao, P.K. Vasudev, Conformal electroless copper deposition for sub-0.5 μm interconnect wiring of very high aspect ratio, in Proc. 190th ECS Meeting, The Electrochemical Society, San Antonio, Texas, 1996, p. 330.
    • (1996) Proc. 190th ECS Meeting , pp. 330
    • Lopatin, S.1    Shacham-Diamand, Y.2    Dubin, V.3    Pellerin, J.4    Zhao, B.5    Vasudev, P.K.6
  • 6
  • 9
    • 0030288844 scopus 로고    scopus 로고
    • A novel seed layer scheme to protect catalytic surfaces for electroless deposition
    • M.J. DeSilva, Y. Shacham-Diamand, A Novel Seed Layer Scheme To Protect Catalytic Surfaces For Electroless Deposition, J. Electrochemic. Soc. 143(11) (1996) 3512.
    • (1996) J. Electrochemic. Soc. , vol.143 , Issue.11 , pp. 3512
    • DeSilva, M.J.1    Shacham-Diamand, Y.2
  • 11
    • 30244523039 scopus 로고    scopus 로고
    • Chaska, Minnesota, Private communication
    • V. Nguyen, FSI International, Chaska, Minnesota, Private communication 1996.
    • (1996) FSI International
    • Nguyen, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.