-
2
-
-
0028524183
-
Bias of mean value and mean square value measurements based on quantized data
-
Oct.
-
Kollar I. Bias of mean value and mean square value measurements based on quantized data. IEEE Trans. Instrum. Meas. 43(5):1994 (Oct.);733-739.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.5
, pp. 733-739
-
-
Kollar, I.1
-
3
-
-
0030126704
-
Statistical theory of quantization
-
Apr.
-
Widrow B., Kollar I. Statistical theory of quantization. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);353-361.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 353-361
-
-
Widrow, B.1
Kollar, I.2
-
5
-
-
0032180593
-
Code probability distributions of A/D converters with random input noise
-
Oct.
-
Souders T.M. Code probability distributions of A/D converters with random input noise. IEEE Trans. Instrum. Meas. 47(5):1998 (Oct.);1042-1045.
-
(1998)
IEEE Trans. Instrum. Meas.
, vol.47
, Issue.5
, pp. 1042-1045
-
-
Souders, T.M.1
-
6
-
-
0031698756
-
Analog-to-digital converters: Towards a generalization of Widrow's theorem
-
May
-
Pacut A., Hejn K. Analog-to-digital converters: towards a generalization of Widrow's theorem. Proc. IEEE IMTC/98. 2:1998 (May);1190-1197.
-
(1998)
Proc. IEEE IMTC/98
, vol.2
, pp. 1190-1197
-
-
Pacut, A.1
Hejn, K.2
-
7
-
-
0032156935
-
Equivalence of Widrow's and Gray's approaches to uniform quantizers
-
Pacut A., Hejn K. Equivalence of Widrow's and Gray's approaches to uniform quantizers. Comput. Stand. Interfaces. 19(3-4):1998;205-212.
-
(1998)
Comput. Stand. Interfaces
, vol.19
, Issue.3-4
, pp. 205-212
-
-
Pacut, A.1
Hejn, K.2
-
8
-
-
0024681113
-
Validity of uniform quantization error model for sinusoidal signals without and with dither
-
June
-
Wagdy M.F., Ng W.M. Validity of uniform quantization error model for sinusoidal signals without and with dither. IEEE Trans. Instrum. Meas. 38(3):1989 (June);718-722.
-
(1989)
IEEE Trans. Instrum. Meas.
, vol.38
, Issue.3
, pp. 718-722
-
-
Wagdy, M.F.1
Ng, W.M.2
-
10
-
-
0141441356
-
Quantization error for a sine wave: A comprehensive approach
-
Sept.
-
D. Bellan, A. Brandolini, A. Gandelli, Quantization error for a sine wave: a comprehensive approach, Proc. of IMEKO TC-4 3rd Int. Workshop on ADC Modeling and Testing, pp. 128, vol. 1, pp. 399-404, 1998 Sept.
-
(1998)
Proc. of IMEKO TC-4 3rd Int. Workshop on ADC Modeling and Testing
, vol.1
, pp. 128
-
-
Bellan, D.1
Brandolini, A.2
Gandelli, A.3
-
12
-
-
0032089929
-
Dithering design for measurement of slowly varying signals
-
Aumala O., Holub J. Dithering design for measurement of slowly varying signals. Measurement. 23(4):1998;271-276.
-
(1998)
Measurement
, vol.23
, Issue.4
, pp. 271-276
-
-
Aumala, O.1
Holub, J.2
-
13
-
-
0030231622
-
Turning interference and noise into improved resolution
-
Aumala O. Turning interference and noise into improved resolution. Measurement. 19(1):1996;41-48.
-
(1996)
Measurement
, vol.19
, Issue.1
, pp. 41-48
-
-
Aumala, O.1
-
14
-
-
0141552877
-
Dithering design of data acquisition of noise or interference corrupted measurement signals
-
Tampere, Finland, June
-
Aumala O. Dithering design of data acquisition of noise or interference corrupted measurement signals. Proc. of XIV IMEKO World Congress, Tampere, Finland. vol. 4A:1997 (June);195-200.
-
(1997)
Proc. of XIV IMEKO World Congress
, vol.4 A
, pp. 195-200
-
-
Aumala, O.1
-
15
-
-
0028422364
-
Dither signal effects on the resolution of nonlinear quantizers
-
Apr.
-
Carbone P., Narduzzi C., Petri D. Dither signal effects on the resolution of nonlinear quantizers. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);139-145.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.2
, pp. 139-145
-
-
Carbone, P.1
Narduzzi, C.2
Petri, D.3
-
16
-
-
0028422448
-
Linearizing average transfer characteristics of ideal ADC's via analog and digital dither
-
Apr.
-
Wagdy M.F., Goff M. Linearizing average transfer characteristics of ideal ADC's via analog and digital dither. IEEE Trans. Instrum. Meas. 43(2): 1994 (Apr.);146-150.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.2
, pp. 146-150
-
-
Wagdy, M.F.1
Goff, M.2
-
17
-
-
0030128702
-
Effect of additive dither on the resolution of ADC's with single-bit or multibit errors
-
Apr.
-
Wagdy M.F. Effect of additive dither on the resolution of ADC's with single-bit or multibit errors. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);610-615.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 610-615
-
-
Wagdy, M.F.1
-
18
-
-
0031702153
-
Simulation results on A/D converter dithering
-
May
-
Wagdy M.F. Simulation results on A/D converter dithering. Proc. IEEE IMTC/98. 1:1998 (May);78-83.
-
(1998)
Proc. IEEE IMTC/98
, vol.1
, pp. 78-83
-
-
Wagdy, M.F.1
-
19
-
-
0031164093
-
Quantitative criteria for the design of dither-based quantizing systems
-
June
-
Carbone P. Quantitative criteria for the design of dither-based quantizing systems. IEEE Trans. Instrum. Meas. 46(3):1997 (June);656-659.
-
(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, Issue.3
, pp. 656-659
-
-
Carbone, P.1
-
21
-
-
0030085206
-
Generalized model of the quantization error - A unified approach
-
Feb.
-
Hejn K., Pacut A. Generalized model of the quantization error - a unified approach. IEEE Trans. Instrum. Meas. 45(1):1996 (Feb.);41-44.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.1
, pp. 41-44
-
-
Hejn, K.1
Pacut, A.2
-
22
-
-
0031075238
-
Uncertainties in quantization noise estimates for analog-to-digital converters
-
Feb.
-
Chiorboli G., Franco G., Morandi C. Uncertainties in quantization noise estimates for analog-to-digital converters. IEEE Trans. Instrum. Meas. 46(1):1997 (Feb.);56-60.
-
(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, Issue.1
, pp. 56-60
-
-
Chiorboli, G.1
Franco, G.2
Morandi, C.3
-
23
-
-
0028449871
-
An improved code density test for the dynamic characterization of flash A/D converters
-
June
-
Morandi C., Niccolai L. An improved code density test for the dynamic characterization of flash A/D converters. IEEE Trans. Instrum. Meas. 43(3):1994 (June);384-388.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.3
, pp. 384-388
-
-
Morandi, C.1
Niccolai, L.2
-
24
-
-
0030282350
-
ADC modeling techniques: A review
-
Nov.-Dec.
-
Baccigalupi A., D'Apuzzo M. ADC modeling techniques: a review. Measurement. 19(3-4):1996 (Nov.-Dec.);139-146.
-
(1996)
Measurement
, vol.19
, Issue.3-4
, pp. 139-146
-
-
Baccigalupi, A.1
D'Apuzzo, M.2
-
25
-
-
0030079062
-
A behavioural model for scan converter-based transient digitizers
-
Feb.
-
Arpaia P., Cennamo F., Daponte P., D'Apuzzo M. A behavioural model for scan converter-based transient digitizers. Measurement. 17(2):1996 (Feb.);103-114.
-
(1996)
Measurement
, vol.17
, Issue.2
, pp. 103-114
-
-
Arpaia, P.1
Cennamo, F.2
Daponte, P.3
D'Apuzzo, M.4
-
26
-
-
48349123559
-
Behavioral model of pipeline ADC by using Simulink
-
Austin, Texas, USA, Feb.
-
Bilhan E., Estrada-Gutierrez P.C., Valero-Lopez A.Y., Maloberti F. Behavioral model of pipeline ADC by using Simulink. Proc. of Southwest Symp. on Mixed-Signal Design 2001, Austin, Texas, USA. 2001 (Feb.);147-151.
-
(2001)
Proc. of Southwest Symp. on Mixed-Signal Design 2001
, pp. 147-151
-
-
Bilhan, E.1
Estrada-Gutierrez, P.C.2
Valero-Lopez, A.Y.3
Maloberti, F.4
-
27
-
-
0026120928
-
A behavioral model of A/D converters using a mixed mode simulator
-
Mar.
-
Ruan G. A behavioral model of A/D converters using a mixed mode simulator. IEEE J. Solid-State Circuits. 26(3):1991 (Mar.);283-290.
-
(1991)
IEEE J. Solid-State Circuits
, vol.26
, Issue.3
, pp. 283-290
-
-
Ruan, G.1
-
31
-
-
0025544915
-
A framework for design and testing of analog integrated circuits
-
Dec.
-
Soenen E.G., VanPeteghem P.M., Liu H.C., Narayan S., Cummings J.T. A framework for design and testing of analog integrated circuits. IEEE Trans. Instrum. Meas. 39(6):1990 (Dec.);890-893.
-
(1990)
IEEE Trans. Instrum. Meas.
, vol.39
, Issue.6
, pp. 890-893
-
-
Soenen, E.G.1
VanPeteghem, P.M.2
Liu, H.C.3
Narayan, S.4
Cummings, J.T.5
-
32
-
-
0028062625
-
Precision behavioural modelling of circuit components for data converters
-
Cambridge, UK, July
-
Brigati S., Liberali V., Maloberti F. Precision behavioural modelling of circuit components for data converters. Proc. of 2nd Int. IEEE Conf. on Advanced A/D and D/A Conversion Techniques and their Applications, Cambridge, UK. 1994 (July);110-115.
-
(1994)
Proc. of 2nd Int. IEEE Conf. on Advanced A/D and D/A Conversion Techniques and their Applications
, pp. 110-115
-
-
Brigati, S.1
Liberali, V.2
Maloberti, F.3
-
33
-
-
0030128347
-
Error compensation of A/D converters using neural networks
-
Apr.
-
Baccigalupi A., Bernieri A., Liguori C. Error compensation of A/D converters using neural networks. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);640-644.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 640-644
-
-
Baccigalupi, A.1
Bernieri, A.2
Liguori, C.3
-
34
-
-
0028749571
-
A neural network approach for identification and fault diagnosis on dynamic systems
-
Dec.
-
Bernieri A., D'Apuzzo M., Sansone L., Savastano M. A neural network approach for identification and fault diagnosis on dynamic systems. IEEE Trans. Instrum. Meas. 43(6):1994 (Dec.);867-873.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.6
, pp. 867-873
-
-
Bernieri, A.1
D'Apuzzo, M.2
Sansone, L.3
Savastano, M.4
-
37
-
-
0022564875
-
Dynamic characterization and compensation of analog to digital converters
-
May
-
Irons F.H. Dynamic characterization and compensation of analog to digital converters. IEEE Int. Symp. Circuits Syst. 1986 (May);1273-1277.
-
(1986)
IEEE Int. Symp. Circuits Syst.
, pp. 1273-1277
-
-
Irons, F.H.1
-
38
-
-
0028421963
-
Analog-to-digital conversion and harmonic noises due to the integral nonlinearity
-
Apr.
-
Kim K. Analog-to-digital conversion and harmonic noises due to the integral nonlinearity. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);151-156.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.2
, pp. 151-156
-
-
Kim, K.1
-
39
-
-
0033361489
-
Influence of the architecture on ADC error modeling
-
Oct.
-
Arpaia P., Daponte P., Michaeli L. Influence of the architecture on ADC error modeling. IEEE Trans. Instrum. Meas. 48(5):1999 (Oct.);956-966.
-
(1999)
IEEE Trans. Instrum. Meas.
, vol.48
, Issue.5
, pp. 956-966
-
-
Arpaia, P.1
Daponte, P.2
Michaeli, L.3
-
40
-
-
0024123140
-
Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement
-
Dec.
-
Jenq Y.C., Crosby P. Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement. IEEE Trans. Instrum. Meas. 37(4):1988 (Dec.);529-532.
-
(1988)
IEEE Trans. Instrum. Meas.
, vol.37
, Issue.4
, pp. 529-532
-
-
Jenq, Y.C.1
Crosby, P.2
-
41
-
-
0028422336
-
Waveform estimation with jitter noise using stochastic up and down method
-
Apr.
-
Wei-Da H., Jenq Y.C. Waveform estimation with jitter noise using stochastic up and down method. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);200-203.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.2
, pp. 200-203
-
-
Wei-Da, H.1
Jenq, Y.C.2
-
42
-
-
0026171568
-
More on jitter effects on sinewave measurement
-
June
-
Awad S.S., Wagdy M.F. More on jitter effects on sinewave measurement. IEEE Trans. Instrum. Meas. 40(3):1991 (June);549-555.
-
(1991)
IEEE Trans. Instrum. Meas.
, vol.40
, Issue.3
, pp. 549-555
-
-
Awad, S.S.1
Wagdy, M.F.2
-
43
-
-
0037332946
-
Characterization of digitizer timebase jitter by means of the Allan variance
-
Arpaia P., Daponte P., Rapuano S. Characterization of digitizer timebase jitter by means of the Allan variance. Computer Standards and Interfaces. 25(1):2003;15-22.
-
(2003)
Computer Standards and Interfaces
, vol.25
, Issue.1
, pp. 15-22
-
-
Arpaia, P.1
Daponte, P.2
Rapuano, S.3
-
44
-
-
0030127008
-
An improved sine-wave fitting procedure for characterizing data acquisition channels
-
Apr.
-
Pintelon R., Schoukens J. An improved sine-wave fitting procedure for characterizing data acquisition channels. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);588-593.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 588-593
-
-
Pintelon, R.1
Schoukens, J.2
-
45
-
-
0031988214
-
Comparison of time base nonlinearity measurement techniques
-
Feb.
-
Stenbakken G., Deyst J. Comparison of time base nonlinearity measurement techniques. IEEE Trans. Instrum. Meas. 47(1):1998 (Feb.);34-39.
-
(1998)
IEEE Trans. Instrum. Meas.
, vol.47
, Issue.1
, pp. 34-39
-
-
Stenbakken, G.1
Deyst, J.2
-
46
-
-
0035722238
-
Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors
-
Dec.
-
Pintelon R., Schoukens J. Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors. IEEE Trans. Instrum. Meas. 50(6):2001 (Dec.);1753-1760.
-
(2001)
IEEE Trans. Instrum. Meas.
, vol.50
, Issue.6
, pp. 1753-1760
-
-
Pintelon, R.1
Schoukens, J.2
-
47
-
-
0035483997
-
An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions
-
Oct.
-
Vandersteen G., Rolain Y., Schoukens J. An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions. IEEE Trans. Instrum. Meas. 50(5):2001 (Oct.);1355-1363.
-
(2001)
IEEE Trans. Instrum. Meas.
, vol.50
, Issue.5
, pp. 1355-1363
-
-
Vandersteen, G.1
Rolain, Y.2
Schoukens, J.3
-
48
-
-
0034835990
-
Measurement of frequency response functions in the presence of correlated input/output errors
-
May
-
Pintelon R., Schoukens J. Measurement of frequency response functions in the presence of correlated input/output errors. Proc. IEEE IMTC 2001. 1:2001 (May);2-7.
-
(2001)
Proc. IEEE IMTC 2001
, vol.1
, pp. 2-7
-
-
Pintelon, R.1
Schoukens, J.2
-
49
-
-
0031681153
-
System identification for data acquisition characterization
-
May
-
Vandersteen G., Rolain Y., Schoukens J. System identification for data acquisition characterization. Proc. IEEE IMTC/98. 2:1998 (May);1211-1216.
-
(1998)
Proc. IEEE IMTC/98
, vol.2
, pp. 1211-1216
-
-
Vandersteen, G.1
Rolain, Y.2
Schoukens, J.3
-
50
-
-
0031198135
-
A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter
-
Aug.
-
Schoukens J., Pintelon R., Vandersteen G. A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter. IEEE Trans. Instrum. Meas. 46(4):1997 (Aug.);1005-1010.
-
(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, Issue.4
, pp. 1005-1010
-
-
Schoukens, J.1
Pintelon, R.2
Vandersteen, G.3
-
51
-
-
0029357526
-
A critical note on histogram testing of data acquisition channels
-
Aug.
-
Schoukens J. A critical note on histogram testing of data acquisition channels. IEEE Trans. Instrum. Meas. 44(4):1995 (Aug.);860-863.
-
(1995)
IEEE Trans. Instrum. Meas.
, vol.44
, Issue.4
, pp. 860-863
-
-
Schoukens, J.1
-
52
-
-
0026173778
-
Another step towards an ideal data acquisition channel
-
June
-
Kollar I., Pintelon R., Rolain Y., Schoukens J. Another step towards an ideal data acquisition channel. IEEE Trans. Instrum. Meas. 40(3):1991 (June);659-660.
-
(1991)
IEEE Trans. Instrum. Meas.
, vol.40
, Issue.3
, pp. 659-660
-
-
Kollar, I.1
Pintelon, R.2
Rolain, Y.3
Schoukens, J.4
-
53
-
-
0029234712
-
Modeling of non-ideal dynamic characteristics in S/H-ADC devices
-
Apr.
-
Mirri D., Iuculano G., Filicori F., Pasini G., Vannini G. Modeling of non-ideal dynamic characteristics in S/H-ADC devices. Proc. IEEE IMTC/95. 1995 (Apr.);27.
-
(1995)
Proc. IEEE IMTC/95
, pp. 27
-
-
Mirri, D.1
Iuculano, G.2
Filicori, F.3
Pasini, G.4
Vannini, G.5
-
54
-
-
0141441321
-
The problem of the standard characterization of ADC and digitising waveform recorder
-
Wien, Austria, Sept.
-
Savino M. The problem of the standard characterization of ADC and digitising waveform recorder. Proc. of V IMEKO TC-4 Workshop on ADC Modeling and Testing, Wien, Austria. 2000 (Sept.);301-305.
-
(2000)
Proc. of V IMEKO TC-4 Workshop on ADC Modeling and Testing
, pp. 301-305
-
-
Savino, M.1
-
55
-
-
0024915507
-
Diagnosing ADC nonlinearity at the bit level
-
Dec.
-
Wagdy M.F. Diagnosing ADC nonlinearity at the bit level. IEEE Trans. Instrum. Meas. 38(6):1989 (Dec.);1114-1139.
-
(1989)
IEEE Trans. Instrum. Meas.
, vol.38
, Issue.6
, pp. 1114-1139
-
-
Wagdy, M.F.1
-
56
-
-
0026853150
-
Some theorems on Walsh transforms of quantizer differential and integral nonlinearity
-
Apr.
-
Hejn K., Kale I. Some theorems on Walsh transforms of quantizer differential and integral nonlinearity. IEEE Trans. Instrum. Meas. 41(2):1992 (Apr.);218-225.
-
(1992)
IEEE Trans. Instrum. Meas.
, vol.41
, Issue.2
, pp. 218-225
-
-
Hejn, K.1
Kale, I.2
-
58
-
-
0031677214
-
ADC nonlinearities and harmonic distortion in FFT test
-
May
-
Bellan D., Brandolini A., Gandelli A. ADC nonlinearities and harmonic distortion in FFT test. IEEE IMTC/98. 2:1998 (May);1233-1238.
-
(1998)
IEEE IMTC/98
, vol.2
, pp. 1233-1238
-
-
Bellan, D.1
Brandolini, A.2
Gandelli, A.3
-
59
-
-
0029723513
-
Dynamic testing of A/D converters: How many samples for a given precision?
-
June
-
Dallet D., Valeze F., Kadionik P., Benkais M., Marchegay P. Dynamic testing of A/D converters: how many samples for a given precision? IEEE IMTC/96. 2:1996 (June);1298-1303.
-
(1996)
IEEE IMTC/96
, vol.2
, pp. 1298-1303
-
-
Dallet, D.1
Valeze, F.2
Kadionik, P.3
Benkais, M.4
Marchegay, P.5
-
60
-
-
0035414883
-
A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
-
Aug.
-
Arpaia P., Serra A.C., Monteiro C.L. A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing. IEEE Trans. Instrum. Meas. 50(4):2001 (Aug.);941-948.
-
(2001)
IEEE Trans. Instrum. Meas.
, vol.50
, Issue.4
, pp. 941-948
-
-
Arpaia, P.1
Serra, A.C.2
Monteiro, C.L.3
-
61
-
-
0034833080
-
Phase-spectrum analysis for detection of ADC hysteretic distortion
-
May
-
Monteiro C.L., Arpaia P., Serra A.C. Phase-spectrum analysis for detection of ADC hysteretic distortion. Proc. IEEE IMTC 2001. 3:2001 (May);1677-1683.
-
(2001)
Proc. IEEE IMTC 2001
, vol.3
, pp. 1677-1683
-
-
Monteiro, C.L.1
Arpaia, P.2
Serra, A.C.3
-
62
-
-
0030128149
-
Testing and optimising ADC performance: A probabilistic approach
-
Apr.
-
Giaquinto N., Savino M., Trotta A. Testing and optimising ADC performance: a probabilistic approach. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);621-626.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 621-626
-
-
Giaquinto, N.1
Savino, M.2
Trotta, A.3
-
63
-
-
0141441317
-
Minimization of parameters number describing accuracy of data acquisition system
-
Foros, Ukraine, July
-
Bykov A.P., Didenko V.I., Movchan A.L., Solodov J.S. Minimization of parameters number describing accuracy of data acquisition system. Proc. of IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, Foros, Ukraine. 2001 (July);148-151.
-
(2001)
Proc. of IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications
, pp. 148-151
-
-
Bykov, A.P.1
Didenko, V.I.2
Movchan, A.L.3
Solodov, J.S.4
-
64
-
-
0141441316
-
Computerised investigation of robust measurement systems
-
Foros, Ukraine, July
-
Kolev N., Yordanova S., Tzvetkov P. Computerised investigation of robust measurement systems. IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications, Foros, Ukraine. 2001 (July);211-214.
-
(2001)
IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications
, pp. 211-214
-
-
Kolev, N.1
Yordanova, S.2
Tzvetkov, P.3
-
65
-
-
0141664338
-
Development of the integrating analog to digital converter for distributive data acquisition systems with improved noise immunity
-
Foros, Ukraine, July
-
Kochan R., Berezky O., Karachka A., Maruschak I., Bojko O. Development of the integrating analog to digital converter for distributive data acquisition systems with improved noise immunity. IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications, Foros, Ukraine. 2001 (July);193-196.
-
(2001)
IEEE Int. Workshop on Intelligent Data Acquisition and Advanced Computing Systems Technology and Applications
, pp. 193-196
-
-
Kochan, R.1
Berezky, O.2
Karachka, A.3
Maruschak, I.4
Bojko, O.5
-
66
-
-
0027667249
-
TOSCA: A simulator for switched-capacitor noise-shaping A/D converters
-
Sept.
-
Liberali V., Dias V.F., Ciapponi M., Maloberti F. TOSCA: a simulator for switched-capacitor noise-shaping A/D converters. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 12(9):1993 (Sept.);1376-1386.
-
(1993)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
, vol.12
, Issue.9
, pp. 1376-1386
-
-
Liberali, V.1
Dias, V.F.2
Ciapponi, M.3
Maloberti, F.4
-
67
-
-
0033342427
-
LEMMA-ADC: The linear error mechanism modelling algorithm applied to A/D converters
-
(Conf. Publ. No. 466), Glasgow, UK, July
-
Carroll B., Wegener C., Kennedy M.P. LEMMA-ADC: the linear error mechanism modelling algorithm applied to A/D converters. Proc. of 3rd IEEE Int. Conf. on Advanced A/D and D/A Conversion Techniques and Their Applications (Conf. Publ. No. 466), Glasgow, UK. 1999 (July);145-148.
-
(1999)
Proc. of 3rd IEEE Int. Conf. on Advanced A/D and D/A Conversion Techniques and Their Applications
, pp. 145-148
-
-
Carroll, B.1
Wegener, C.2
Kennedy, M.P.3
-
70
-
-
0032158147
-
Behavioural modelling of sigma-delta modulators
-
Sept.
-
Fischer G., Davis A.J. Behavioural modelling of sigma-delta modulators. Comput. Stand. Interfaces. 19(3-4):1998 (Sept.);189-203.
-
(1998)
Comput. Stand. Interfaces
, vol.19
, Issue.3-4
, pp. 189-203
-
-
Fischer, G.1
Davis, A.J.2
-
72
-
-
0141441314
-
-
http://rf.rfglobalnet.com/software_modeling/software/2/551.htm.
-
-
-
-
73
-
-
0141776230
-
-
Cirrus Logic, Crystal, http://www.cirrus.com/design/products/overview/detail.cfm?d=266 .
-
Crystal
-
-
-
74
-
-
0036049146
-
A fourth-order single-bit switched-capacitor Sigma-Delta modulator for distributed sensor applications
-
Anchorage, Alaska, USA, May
-
Brigati S., Francesconi F., Malcovati P., Maloberti F. A fourth-order single-bit switched-capacitor Sigma-Delta modulator for distributed sensor applications. Proc. of IEEE Instrumentation and Measurement Technology Conference, Anchorage, Alaska, USA. 2002 (May);21-23.
-
(2002)
Proc. of IEEE Instrumentation and Measurement Technology Conference
, pp. 21-23
-
-
Brigati, S.1
Francesconi, F.2
Malcovati, P.3
Maloberti, F.4
-
75
-
-
0041343847
-
Measurement and enhancement of multistage sigma-delta modulators
-
May
-
Hejn K., Murphy P., Kale I. Measurement and enhancement of multistage sigma-delta modulators. Proc. IEEE IMTC/92. 1992 (May);715-719.
-
(1992)
Proc. IEEE IMTC/92
, pp. 715-719
-
-
Hejn, K.1
Murphy, P.2
Kale, I.3
-
76
-
-
0031673584
-
Modeling and characterization of sigma-delta analog-to-digital converters
-
May (in press on IEEE Trans. on Instrumentation and Measurement)
-
Arpaia P., Cennamo F., Daponte P., Schumny H. Modeling and characterization of sigma-delta analog-to-digital converters. Proc. IEEE IMTC/98. 1998 (May);96-100. (in press on IEEE Trans. on Instrumentation and Measurement).
-
(1998)
Proc. IEEE IMTC/98
, pp. 96-100
-
-
Arpaia, P.1
Cennamo, F.2
Daponte, P.3
Schumny, H.4
-
77
-
-
0032022014
-
Wideband cascade delta-sigma modulator with digital correction for finite amplifier gain effects
-
Mar.
-
Fischer G., Davis A.J. Wideband cascade delta-sigma modulator with digital correction for finite amplifier gain effects. Electron. Lett. 34(6): 1998 (Mar.);511-512.
-
(1998)
Electron. Lett.
, vol.34
, Issue.6
, pp. 511-512
-
-
Fischer, G.1
Davis, A.J.2
-
78
-
-
0034248854
-
Efficient architectures for time-interleaved oversampling delta-sigma converters
-
Aug.
-
Kozak M., Karaman M., Kale I. Efficient architectures for time-interleaved oversampling delta-sigma converters. IEEE Trans. Circuits Syst., II Analog Digit. Signal Process. 47(8):2000 (Aug.);802-810.
-
(2000)
IEEE Trans. Circuits Syst., II Analog Digit. Signal Process
, vol.47
, Issue.8
, pp. 802-810
-
-
Kozak, M.1
Karaman, M.2
Kale, I.3
-
82
-
-
0023211501
-
A phase-plane approach to the compensation of high-speed analog-to-digital converters
-
May
-
Rebold T.A., Irons F.H. A phase-plane approach to the compensation of high-speed analog-to-digital converters. Proc. IEEE Int. Symp. Circuits Syst. 1987 (May);455-458.
-
(1987)
Proc. IEEE Int. Symp. Circuits Syst.
, pp. 455-458
-
-
Rebold, T.A.1
Irons, F.H.2
-
83
-
-
0038651558
-
Wideband distortion compensation for bipolar flash analog-to-digital converters
-
May
-
Deyst J.P., Vytal J.J., Blasche P.R., Siebert W.M. Wideband distortion compensation for bipolar flash analog-to-digital converters. Proc. IMTC/92. 1992 (May);290-294.
-
(1992)
Proc. IMTC/92
, pp. 290-294
-
-
Deyst, J.P.1
Vytal, J.J.2
Blasche, P.R.3
Siebert, W.M.4
-
84
-
-
0028750463
-
Phase plane compensation of the NIST sampling comparator system
-
May
-
Deyst J.P., Souders T.M. Phase plane compensation of the NIST sampling comparator system. Proc. IMTC/94. 2:1994 (May);914-916.
-
(1994)
Proc. IMTC/94
, vol.2
, pp. 914-916
-
-
Deyst, J.P.1
Souders, T.M.2
-
85
-
-
84904557057
-
Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analog-to-digital converters using the Volterra and Wiener methods
-
South Lake Tahoe, California, USA, June
-
Tsimbinos J., Lever K.V. Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analog-to-digital converters using the Volterra and Wiener methods. Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics, South Lake Tahoe, California, USA. 1993 (June);379-383.
-
(1993)
Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics
, pp. 379-383
-
-
Tsimbinos, J.1
Lever, K.V.2
-
87
-
-
0028387782
-
Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals
-
Mar.
-
Tsimbinos J., Lever K.V. Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals. Electron. Lett. 30(6):1994 (Mar.);461-462.
-
(1994)
Electron. Lett.
, vol.30
, Issue.6
, pp. 461-462
-
-
Tsimbinos, J.1
Lever, K.V.2
-
88
-
-
0030128347
-
Error compensation of A/D converters using neural networks
-
Apr.
-
Baccigalupi A., Bernieri A., Liguori C. Error compensation of A/D converters using neural networks. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);640-644.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, Issue.2
, pp. 640-644
-
-
Baccigalupi, A.1
Bernieri, A.2
Liguori, C.3
-
89
-
-
0029723080
-
Distortion compensation for time-interleaved analog to digital converters
-
June
-
Hummels D.M., McDonald J.J. II, Irons F.H. Distortion compensation for time-interleaved analog to digital converters. Proc. IMTC/96. 1996 (June);728-731.
-
(1996)
Proc. IMTC/96
, pp. 728-731
-
-
Hummels, D.M.1
McDonald J.J. II2
Irons, F.H.3
-
90
-
-
0141776229
-
Improved dynamic compensation of ADCs using an iterative estimate of the ADC calibration signal
-
Washington, DC, USA, Aug.
-
Hummels D.M., Kennedy S.P. Improved dynamic compensation of ADCs using an iterative estimate of the ADC calibration signal. Proc. of 35th Midwest Symposium on Circuits and Systems, Washington, DC, USA. 1992 (Aug.);68-71.
-
(1992)
Proc. of 35th Midwest Symposium on Circuits and Systems
, pp. 68-71
-
-
Hummels, D.M.1
Kennedy, S.P.2
-
93
-
-
0034833090
-
A new bidimensional histogram for the dynamic characterization of ADCs
-
May
-
Acunto S., Arpaia P., Irons F.H., Hummels D.M. A new bidimensional histogram for the dynamic characterization of ADCs. Proc. IEEE IMTC 2001. 3: 2001 (May);2015-2020.
-
(2001)
Proc. IEEE IMTC 2001
, vol.3
, pp. 2015-2020
-
-
Acunto, S.1
Arpaia, P.2
Irons, F.H.3
Hummels, D.M.4
-
94
-
-
0032131667
-
Analytical a priori approach to phase-plane modeling of SAR A/D converters
-
Aug.
-
Arpaia P., Daponte P., Michaeli L. Analytical a priori approach to phase-plane modeling of SAR A/D converters. IEEE Trans. Instrum. Meas. 47(4):1998 (Aug.);849-857.
-
(1998)
IEEE Trans. Instrum. Meas.
, vol.47
, Issue.4
, pp. 849-857
-
-
Arpaia, P.1
Daponte, P.2
Michaeli, L.3
-
95
-
-
0141552868
-
Computer simulation of autocalibration for successive approximation A/D converter
-
Warsaw, Poland, May
-
Michaeli L. Computer simulation of autocalibration for successive approximation A/D converter. 2nd Int. IMEKO TC-4 Symposium, Warsaw, Poland. 1987 (May);125-131.
-
(1987)
2nd Int. IMEKO TC-4 Symposium
, pp. 125-131
-
-
Michaeli, L.1
-
96
-
-
0034833106
-
DNL ADC testing by the exponential shaped voltage
-
May
-
Holcer R., Michaeli L. DNL ADC testing by the exponential shaped voltage. Proc. IEEE IMTC 2001. 1:2001 (May);693-697
-
(2001)
Proc. IEEE IMTC 2001
, vol.1
, pp. 693-697
-
-
Holcer, R.1
Michaeli, L.2
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