메뉴 건너뛰기




Volumn 26, Issue 1, 2004, Pages 31-42

A state of the art on ADC modelling

Author keywords

ADC; Error correction; Error models; Modelling; Quantization models

Indexed keywords

COMPUTER SIMULATION; ERROR CORRECTION; TRANSFER FUNCTIONS;

EID: 0141866711     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(03)00060-6     Document Type: Conference Paper
Times cited : (35)

References (96)
  • 2
    • 0028524183 scopus 로고
    • Bias of mean value and mean square value measurements based on quantized data
    • Oct.
    • Kollar I. Bias of mean value and mean square value measurements based on quantized data. IEEE Trans. Instrum. Meas. 43(5):1994 (Oct.);733-739.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.5 , pp. 733-739
    • Kollar, I.1
  • 3
    • 0030126704 scopus 로고    scopus 로고
    • Statistical theory of quantization
    • Apr.
    • Widrow B., Kollar I. Statistical theory of quantization. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);353-361.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 353-361
    • Widrow, B.1    Kollar, I.2
  • 5
    • 0032180593 scopus 로고    scopus 로고
    • Code probability distributions of A/D converters with random input noise
    • Oct.
    • Souders T.M. Code probability distributions of A/D converters with random input noise. IEEE Trans. Instrum. Meas. 47(5):1998 (Oct.);1042-1045.
    • (1998) IEEE Trans. Instrum. Meas. , vol.47 , Issue.5 , pp. 1042-1045
    • Souders, T.M.1
  • 6
    • 0031698756 scopus 로고    scopus 로고
    • Analog-to-digital converters: Towards a generalization of Widrow's theorem
    • May
    • Pacut A., Hejn K. Analog-to-digital converters: towards a generalization of Widrow's theorem. Proc. IEEE IMTC/98. 2:1998 (May);1190-1197.
    • (1998) Proc. IEEE IMTC/98 , vol.2 , pp. 1190-1197
    • Pacut, A.1    Hejn, K.2
  • 7
    • 0032156935 scopus 로고    scopus 로고
    • Equivalence of Widrow's and Gray's approaches to uniform quantizers
    • Pacut A., Hejn K. Equivalence of Widrow's and Gray's approaches to uniform quantizers. Comput. Stand. Interfaces. 19(3-4):1998;205-212.
    • (1998) Comput. Stand. Interfaces , vol.19 , Issue.3-4 , pp. 205-212
    • Pacut, A.1    Hejn, K.2
  • 8
    • 0024681113 scopus 로고
    • Validity of uniform quantization error model for sinusoidal signals without and with dither
    • June
    • Wagdy M.F., Ng W.M. Validity of uniform quantization error model for sinusoidal signals without and with dither. IEEE Trans. Instrum. Meas. 38(3):1989 (June);718-722.
    • (1989) IEEE Trans. Instrum. Meas. , vol.38 , Issue.3 , pp. 718-722
    • Wagdy, M.F.1    Ng, W.M.2
  • 12
    • 0032089929 scopus 로고    scopus 로고
    • Dithering design for measurement of slowly varying signals
    • Aumala O., Holub J. Dithering design for measurement of slowly varying signals. Measurement. 23(4):1998;271-276.
    • (1998) Measurement , vol.23 , Issue.4 , pp. 271-276
    • Aumala, O.1    Holub, J.2
  • 13
    • 0030231622 scopus 로고    scopus 로고
    • Turning interference and noise into improved resolution
    • Aumala O. Turning interference and noise into improved resolution. Measurement. 19(1):1996;41-48.
    • (1996) Measurement , vol.19 , Issue.1 , pp. 41-48
    • Aumala, O.1
  • 14
    • 0141552877 scopus 로고    scopus 로고
    • Dithering design of data acquisition of noise or interference corrupted measurement signals
    • Tampere, Finland, June
    • Aumala O. Dithering design of data acquisition of noise or interference corrupted measurement signals. Proc. of XIV IMEKO World Congress, Tampere, Finland. vol. 4A:1997 (June);195-200.
    • (1997) Proc. of XIV IMEKO World Congress , vol.4 A , pp. 195-200
    • Aumala, O.1
  • 15
    • 0028422364 scopus 로고
    • Dither signal effects on the resolution of nonlinear quantizers
    • Apr.
    • Carbone P., Narduzzi C., Petri D. Dither signal effects on the resolution of nonlinear quantizers. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);139-145.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.2 , pp. 139-145
    • Carbone, P.1    Narduzzi, C.2    Petri, D.3
  • 16
    • 0028422448 scopus 로고
    • Linearizing average transfer characteristics of ideal ADC's via analog and digital dither
    • Apr.
    • Wagdy M.F., Goff M. Linearizing average transfer characteristics of ideal ADC's via analog and digital dither. IEEE Trans. Instrum. Meas. 43(2): 1994 (Apr.);146-150.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.2 , pp. 146-150
    • Wagdy, M.F.1    Goff, M.2
  • 17
    • 0030128702 scopus 로고    scopus 로고
    • Effect of additive dither on the resolution of ADC's with single-bit or multibit errors
    • Apr.
    • Wagdy M.F. Effect of additive dither on the resolution of ADC's with single-bit or multibit errors. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);610-615.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 610-615
    • Wagdy, M.F.1
  • 18
    • 0031702153 scopus 로고    scopus 로고
    • Simulation results on A/D converter dithering
    • May
    • Wagdy M.F. Simulation results on A/D converter dithering. Proc. IEEE IMTC/98. 1:1998 (May);78-83.
    • (1998) Proc. IEEE IMTC/98 , vol.1 , pp. 78-83
    • Wagdy, M.F.1
  • 19
    • 0031164093 scopus 로고    scopus 로고
    • Quantitative criteria for the design of dither-based quantizing systems
    • June
    • Carbone P. Quantitative criteria for the design of dither-based quantizing systems. IEEE Trans. Instrum. Meas. 46(3):1997 (June);656-659.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , Issue.3 , pp. 656-659
    • Carbone, P.1
  • 21
    • 0030085206 scopus 로고    scopus 로고
    • Generalized model of the quantization error - A unified approach
    • Feb.
    • Hejn K., Pacut A. Generalized model of the quantization error - a unified approach. IEEE Trans. Instrum. Meas. 45(1):1996 (Feb.);41-44.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.1 , pp. 41-44
    • Hejn, K.1    Pacut, A.2
  • 22
    • 0031075238 scopus 로고    scopus 로고
    • Uncertainties in quantization noise estimates for analog-to-digital converters
    • Feb.
    • Chiorboli G., Franco G., Morandi C. Uncertainties in quantization noise estimates for analog-to-digital converters. IEEE Trans. Instrum. Meas. 46(1):1997 (Feb.);56-60.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , Issue.1 , pp. 56-60
    • Chiorboli, G.1    Franco, G.2    Morandi, C.3
  • 23
    • 0028449871 scopus 로고
    • An improved code density test for the dynamic characterization of flash A/D converters
    • June
    • Morandi C., Niccolai L. An improved code density test for the dynamic characterization of flash A/D converters. IEEE Trans. Instrum. Meas. 43(3):1994 (June);384-388.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.3 , pp. 384-388
    • Morandi, C.1    Niccolai, L.2
  • 24
    • 0030282350 scopus 로고    scopus 로고
    • ADC modeling techniques: A review
    • Nov.-Dec.
    • Baccigalupi A., D'Apuzzo M. ADC modeling techniques: a review. Measurement. 19(3-4):1996 (Nov.-Dec.);139-146.
    • (1996) Measurement , vol.19 , Issue.3-4 , pp. 139-146
    • Baccigalupi, A.1    D'Apuzzo, M.2
  • 25
    • 0030079062 scopus 로고    scopus 로고
    • A behavioural model for scan converter-based transient digitizers
    • Feb.
    • Arpaia P., Cennamo F., Daponte P., D'Apuzzo M. A behavioural model for scan converter-based transient digitizers. Measurement. 17(2):1996 (Feb.);103-114.
    • (1996) Measurement , vol.17 , Issue.2 , pp. 103-114
    • Arpaia, P.1    Cennamo, F.2    Daponte, P.3    D'Apuzzo, M.4
  • 27
    • 0026120928 scopus 로고
    • A behavioral model of A/D converters using a mixed mode simulator
    • Mar.
    • Ruan G. A behavioral model of A/D converters using a mixed mode simulator. IEEE J. Solid-State Circuits. 26(3):1991 (Mar.);283-290.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , Issue.3 , pp. 283-290
    • Ruan, G.1
  • 28
  • 29
  • 33
    • 0030128347 scopus 로고    scopus 로고
    • Error compensation of A/D converters using neural networks
    • Apr.
    • Baccigalupi A., Bernieri A., Liguori C. Error compensation of A/D converters using neural networks. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);640-644.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 640-644
    • Baccigalupi, A.1    Bernieri, A.2    Liguori, C.3
  • 34
    • 0028749571 scopus 로고
    • A neural network approach for identification and fault diagnosis on dynamic systems
    • Dec.
    • Bernieri A., D'Apuzzo M., Sansone L., Savastano M. A neural network approach for identification and fault diagnosis on dynamic systems. IEEE Trans. Instrum. Meas. 43(6):1994 (Dec.);867-873.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.6 , pp. 867-873
    • Bernieri, A.1    D'Apuzzo, M.2    Sansone, L.3    Savastano, M.4
  • 37
    • 0022564875 scopus 로고
    • Dynamic characterization and compensation of analog to digital converters
    • May
    • Irons F.H. Dynamic characterization and compensation of analog to digital converters. IEEE Int. Symp. Circuits Syst. 1986 (May);1273-1277.
    • (1986) IEEE Int. Symp. Circuits Syst. , pp. 1273-1277
    • Irons, F.H.1
  • 38
    • 0028421963 scopus 로고
    • Analog-to-digital conversion and harmonic noises due to the integral nonlinearity
    • Apr.
    • Kim K. Analog-to-digital conversion and harmonic noises due to the integral nonlinearity. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);151-156.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.2 , pp. 151-156
    • Kim, K.1
  • 39
    • 0033361489 scopus 로고    scopus 로고
    • Influence of the architecture on ADC error modeling
    • Oct.
    • Arpaia P., Daponte P., Michaeli L. Influence of the architecture on ADC error modeling. IEEE Trans. Instrum. Meas. 48(5):1999 (Oct.);956-966.
    • (1999) IEEE Trans. Instrum. Meas. , vol.48 , Issue.5 , pp. 956-966
    • Arpaia, P.1    Daponte, P.2    Michaeli, L.3
  • 40
    • 0024123140 scopus 로고
    • Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement
    • Dec.
    • Jenq Y.C., Crosby P. Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement. IEEE Trans. Instrum. Meas. 37(4):1988 (Dec.);529-532.
    • (1988) IEEE Trans. Instrum. Meas. , vol.37 , Issue.4 , pp. 529-532
    • Jenq, Y.C.1    Crosby, P.2
  • 41
    • 0028422336 scopus 로고
    • Waveform estimation with jitter noise using stochastic up and down method
    • Apr.
    • Wei-Da H., Jenq Y.C. Waveform estimation with jitter noise using stochastic up and down method. IEEE Trans. Instrum. Meas. 43(2):1994 (Apr.);200-203.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.2 , pp. 200-203
    • Wei-Da, H.1    Jenq, Y.C.2
  • 42
    • 0026171568 scopus 로고
    • More on jitter effects on sinewave measurement
    • June
    • Awad S.S., Wagdy M.F. More on jitter effects on sinewave measurement. IEEE Trans. Instrum. Meas. 40(3):1991 (June);549-555.
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , Issue.3 , pp. 549-555
    • Awad, S.S.1    Wagdy, M.F.2
  • 43
    • 0037332946 scopus 로고    scopus 로고
    • Characterization of digitizer timebase jitter by means of the Allan variance
    • Arpaia P., Daponte P., Rapuano S. Characterization of digitizer timebase jitter by means of the Allan variance. Computer Standards and Interfaces. 25(1):2003;15-22.
    • (2003) Computer Standards and Interfaces , vol.25 , Issue.1 , pp. 15-22
    • Arpaia, P.1    Daponte, P.2    Rapuano, S.3
  • 44
    • 0030127008 scopus 로고    scopus 로고
    • An improved sine-wave fitting procedure for characterizing data acquisition channels
    • Apr.
    • Pintelon R., Schoukens J. An improved sine-wave fitting procedure for characterizing data acquisition channels. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);588-593.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 588-593
    • Pintelon, R.1    Schoukens, J.2
  • 45
    • 0031988214 scopus 로고    scopus 로고
    • Comparison of time base nonlinearity measurement techniques
    • Feb.
    • Stenbakken G., Deyst J. Comparison of time base nonlinearity measurement techniques. IEEE Trans. Instrum. Meas. 47(1):1998 (Feb.);34-39.
    • (1998) IEEE Trans. Instrum. Meas. , vol.47 , Issue.1 , pp. 34-39
    • Stenbakken, G.1    Deyst, J.2
  • 46
    • 0035722238 scopus 로고    scopus 로고
    • Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors
    • Dec.
    • Pintelon R., Schoukens J. Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors. IEEE Trans. Instrum. Meas. 50(6):2001 (Dec.);1753-1760.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.6 , pp. 1753-1760
    • Pintelon, R.1    Schoukens, J.2
  • 47
    • 0035483997 scopus 로고    scopus 로고
    • An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions
    • Oct.
    • Vandersteen G., Rolain Y., Schoukens J. An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions. IEEE Trans. Instrum. Meas. 50(5):2001 (Oct.);1355-1363.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.5 , pp. 1355-1363
    • Vandersteen, G.1    Rolain, Y.2    Schoukens, J.3
  • 48
    • 0034835990 scopus 로고    scopus 로고
    • Measurement of frequency response functions in the presence of correlated input/output errors
    • May
    • Pintelon R., Schoukens J. Measurement of frequency response functions in the presence of correlated input/output errors. Proc. IEEE IMTC 2001. 1:2001 (May);2-7.
    • (2001) Proc. IEEE IMTC 2001 , vol.1 , pp. 2-7
    • Pintelon, R.1    Schoukens, J.2
  • 49
    • 0031681153 scopus 로고    scopus 로고
    • System identification for data acquisition characterization
    • May
    • Vandersteen G., Rolain Y., Schoukens J. System identification for data acquisition characterization. Proc. IEEE IMTC/98. 2:1998 (May);1211-1216.
    • (1998) Proc. IEEE IMTC/98 , vol.2 , pp. 1211-1216
    • Vandersteen, G.1    Rolain, Y.2    Schoukens, J.3
  • 50
    • 0031198135 scopus 로고    scopus 로고
    • A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter
    • Aug.
    • Schoukens J., Pintelon R., Vandersteen G. A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter. IEEE Trans. Instrum. Meas. 46(4):1997 (Aug.);1005-1010.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , Issue.4 , pp. 1005-1010
    • Schoukens, J.1    Pintelon, R.2    Vandersteen, G.3
  • 51
    • 0029357526 scopus 로고
    • A critical note on histogram testing of data acquisition channels
    • Aug.
    • Schoukens J. A critical note on histogram testing of data acquisition channels. IEEE Trans. Instrum. Meas. 44(4):1995 (Aug.);860-863.
    • (1995) IEEE Trans. Instrum. Meas. , vol.44 , Issue.4 , pp. 860-863
    • Schoukens, J.1
  • 54
    • 0141441321 scopus 로고    scopus 로고
    • The problem of the standard characterization of ADC and digitising waveform recorder
    • Wien, Austria, Sept.
    • Savino M. The problem of the standard characterization of ADC and digitising waveform recorder. Proc. of V IMEKO TC-4 Workshop on ADC Modeling and Testing, Wien, Austria. 2000 (Sept.);301-305.
    • (2000) Proc. of V IMEKO TC-4 Workshop on ADC Modeling and Testing , pp. 301-305
    • Savino, M.1
  • 55
    • 0024915507 scopus 로고
    • Diagnosing ADC nonlinearity at the bit level
    • Dec.
    • Wagdy M.F. Diagnosing ADC nonlinearity at the bit level. IEEE Trans. Instrum. Meas. 38(6):1989 (Dec.);1114-1139.
    • (1989) IEEE Trans. Instrum. Meas. , vol.38 , Issue.6 , pp. 1114-1139
    • Wagdy, M.F.1
  • 56
    • 0026853150 scopus 로고
    • Some theorems on Walsh transforms of quantizer differential and integral nonlinearity
    • Apr.
    • Hejn K., Kale I. Some theorems on Walsh transforms of quantizer differential and integral nonlinearity. IEEE Trans. Instrum. Meas. 41(2):1992 (Apr.);218-225.
    • (1992) IEEE Trans. Instrum. Meas. , vol.41 , Issue.2 , pp. 218-225
    • Hejn, K.1    Kale, I.2
  • 58
    • 0031677214 scopus 로고    scopus 로고
    • ADC nonlinearities and harmonic distortion in FFT test
    • May
    • Bellan D., Brandolini A., Gandelli A. ADC nonlinearities and harmonic distortion in FFT test. IEEE IMTC/98. 2:1998 (May);1233-1238.
    • (1998) IEEE IMTC/98 , vol.2 , pp. 1233-1238
    • Bellan, D.1    Brandolini, A.2    Gandelli, A.3
  • 59
    • 0029723513 scopus 로고    scopus 로고
    • Dynamic testing of A/D converters: How many samples for a given precision?
    • June
    • Dallet D., Valeze F., Kadionik P., Benkais M., Marchegay P. Dynamic testing of A/D converters: how many samples for a given precision? IEEE IMTC/96. 2:1996 (June);1298-1303.
    • (1996) IEEE IMTC/96 , vol.2 , pp. 1298-1303
    • Dallet, D.1    Valeze, F.2    Kadionik, P.3    Benkais, M.4    Marchegay, P.5
  • 60
    • 0035414883 scopus 로고    scopus 로고
    • A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
    • Aug.
    • Arpaia P., Serra A.C., Monteiro C.L. A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing. IEEE Trans. Instrum. Meas. 50(4):2001 (Aug.);941-948.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.4 , pp. 941-948
    • Arpaia, P.1    Serra, A.C.2    Monteiro, C.L.3
  • 61
    • 0034833080 scopus 로고    scopus 로고
    • Phase-spectrum analysis for detection of ADC hysteretic distortion
    • May
    • Monteiro C.L., Arpaia P., Serra A.C. Phase-spectrum analysis for detection of ADC hysteretic distortion. Proc. IEEE IMTC 2001. 3:2001 (May);1677-1683.
    • (2001) Proc. IEEE IMTC 2001 , vol.3 , pp. 1677-1683
    • Monteiro, C.L.1    Arpaia, P.2    Serra, A.C.3
  • 62
    • 0030128149 scopus 로고    scopus 로고
    • Testing and optimising ADC performance: A probabilistic approach
    • Apr.
    • Giaquinto N., Savino M., Trotta A. Testing and optimising ADC performance: a probabilistic approach. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);621-626.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 621-626
    • Giaquinto, N.1    Savino, M.2    Trotta, A.3
  • 68
    • 0032282219 scopus 로고    scopus 로고
    • Symbolic synthesis of analog-to-digital conversion architectures using direct-mapping techniques
    • Sept.
    • Weibiao Z., Huimin X., Al-Omari R., Hassoun M. Symbolic synthesis of analog-to-digital conversion architectures using direct-mapping techniques. Proc. IEEE Int. Conf. Electron. Circuits Syst. 3:1998 (Sept.);215-218.
    • (1998) Proc. IEEE Int. Conf. Electron. Circuits Syst. , vol.3 , pp. 215-218
    • Weibiao, Z.1    Huimin, X.2    Al-Omari, R.3    Hassoun, M.4
  • 70
    • 0032158147 scopus 로고    scopus 로고
    • Behavioural modelling of sigma-delta modulators
    • Sept.
    • Fischer G., Davis A.J. Behavioural modelling of sigma-delta modulators. Comput. Stand. Interfaces. 19(3-4):1998 (Sept.);189-203.
    • (1998) Comput. Stand. Interfaces , vol.19 , Issue.3-4 , pp. 189-203
    • Fischer, G.1    Davis, A.J.2
  • 72
    • 0141441314 scopus 로고    scopus 로고
    • http://rf.rfglobalnet.com/software_modeling/software/2/551.htm.
  • 73
    • 0141776230 scopus 로고    scopus 로고
    • Cirrus Logic, Crystal, http://www.cirrus.com/design/products/overview/detail.cfm?d=266 .
    • Crystal
  • 75
    • 0041343847 scopus 로고
    • Measurement and enhancement of multistage sigma-delta modulators
    • May
    • Hejn K., Murphy P., Kale I. Measurement and enhancement of multistage sigma-delta modulators. Proc. IEEE IMTC/92. 1992 (May);715-719.
    • (1992) Proc. IEEE IMTC/92 , pp. 715-719
    • Hejn, K.1    Murphy, P.2    Kale, I.3
  • 76
    • 0031673584 scopus 로고    scopus 로고
    • Modeling and characterization of sigma-delta analog-to-digital converters
    • May (in press on IEEE Trans. on Instrumentation and Measurement)
    • Arpaia P., Cennamo F., Daponte P., Schumny H. Modeling and characterization of sigma-delta analog-to-digital converters. Proc. IEEE IMTC/98. 1998 (May);96-100. (in press on IEEE Trans. on Instrumentation and Measurement).
    • (1998) Proc. IEEE IMTC/98 , pp. 96-100
    • Arpaia, P.1    Cennamo, F.2    Daponte, P.3    Schumny, H.4
  • 77
    • 0032022014 scopus 로고    scopus 로고
    • Wideband cascade delta-sigma modulator with digital correction for finite amplifier gain effects
    • Mar.
    • Fischer G., Davis A.J. Wideband cascade delta-sigma modulator with digital correction for finite amplifier gain effects. Electron. Lett. 34(6): 1998 (Mar.);511-512.
    • (1998) Electron. Lett. , vol.34 , Issue.6 , pp. 511-512
    • Fischer, G.1    Davis, A.J.2
  • 82
    • 0023211501 scopus 로고
    • A phase-plane approach to the compensation of high-speed analog-to-digital converters
    • May
    • Rebold T.A., Irons F.H. A phase-plane approach to the compensation of high-speed analog-to-digital converters. Proc. IEEE Int. Symp. Circuits Syst. 1987 (May);455-458.
    • (1987) Proc. IEEE Int. Symp. Circuits Syst. , pp. 455-458
    • Rebold, T.A.1    Irons, F.H.2
  • 83
    • 0038651558 scopus 로고
    • Wideband distortion compensation for bipolar flash analog-to-digital converters
    • May
    • Deyst J.P., Vytal J.J., Blasche P.R., Siebert W.M. Wideband distortion compensation for bipolar flash analog-to-digital converters. Proc. IMTC/92. 1992 (May);290-294.
    • (1992) Proc. IMTC/92 , pp. 290-294
    • Deyst, J.P.1    Vytal, J.J.2    Blasche, P.R.3    Siebert, W.M.4
  • 84
    • 0028750463 scopus 로고
    • Phase plane compensation of the NIST sampling comparator system
    • May
    • Deyst J.P., Souders T.M. Phase plane compensation of the NIST sampling comparator system. Proc. IMTC/94. 2:1994 (May);914-916.
    • (1994) Proc. IMTC/94 , vol.2 , pp. 914-916
    • Deyst, J.P.1    Souders, T.M.2
  • 85
    • 84904557057 scopus 로고
    • Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analog-to-digital converters using the Volterra and Wiener methods
    • South Lake Tahoe, California, USA, June
    • Tsimbinos J., Lever K.V. Applications of higher-order statistics to modelling, identification and cancellation of nonlinear distortion in high-speed samplers and analog-to-digital converters using the Volterra and Wiener methods. Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics, South Lake Tahoe, California, USA. 1993 (June);379-383.
    • (1993) Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics , pp. 379-383
    • Tsimbinos, J.1    Lever, K.V.2
  • 86
  • 87
    • 0028387782 scopus 로고
    • Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals
    • Mar.
    • Tsimbinos J., Lever K.V. Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals. Electron. Lett. 30(6):1994 (Mar.);461-462.
    • (1994) Electron. Lett. , vol.30 , Issue.6 , pp. 461-462
    • Tsimbinos, J.1    Lever, K.V.2
  • 88
    • 0030128347 scopus 로고    scopus 로고
    • Error compensation of A/D converters using neural networks
    • Apr.
    • Baccigalupi A., Bernieri A., Liguori C. Error compensation of A/D converters using neural networks. IEEE Trans. Instrum. Meas. 45(2):1996 (Apr.);640-644.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , Issue.2 , pp. 640-644
    • Baccigalupi, A.1    Bernieri, A.2    Liguori, C.3
  • 89
    • 0029723080 scopus 로고    scopus 로고
    • Distortion compensation for time-interleaved analog to digital converters
    • June
    • Hummels D.M., McDonald J.J. II, Irons F.H. Distortion compensation for time-interleaved analog to digital converters. Proc. IMTC/96. 1996 (June);728-731.
    • (1996) Proc. IMTC/96 , pp. 728-731
    • Hummels, D.M.1    McDonald J.J. II2    Irons, F.H.3
  • 90
    • 0141776229 scopus 로고
    • Improved dynamic compensation of ADCs using an iterative estimate of the ADC calibration signal
    • Washington, DC, USA, Aug.
    • Hummels D.M., Kennedy S.P. Improved dynamic compensation of ADCs using an iterative estimate of the ADC calibration signal. Proc. of 35th Midwest Symposium on Circuits and Systems, Washington, DC, USA. 1992 (Aug.);68-71.
    • (1992) Proc. of 35th Midwest Symposium on Circuits and Systems , pp. 68-71
    • Hummels, D.M.1    Kennedy, S.P.2
  • 93
    • 0034833090 scopus 로고    scopus 로고
    • A new bidimensional histogram for the dynamic characterization of ADCs
    • May
    • Acunto S., Arpaia P., Irons F.H., Hummels D.M. A new bidimensional histogram for the dynamic characterization of ADCs. Proc. IEEE IMTC 2001. 3: 2001 (May);2015-2020.
    • (2001) Proc. IEEE IMTC 2001 , vol.3 , pp. 2015-2020
    • Acunto, S.1    Arpaia, P.2    Irons, F.H.3    Hummels, D.M.4
  • 94
    • 0032131667 scopus 로고    scopus 로고
    • Analytical a priori approach to phase-plane modeling of SAR A/D converters
    • Aug.
    • Arpaia P., Daponte P., Michaeli L. Analytical a priori approach to phase-plane modeling of SAR A/D converters. IEEE Trans. Instrum. Meas. 47(4):1998 (Aug.);849-857.
    • (1998) IEEE Trans. Instrum. Meas. , vol.47 , Issue.4 , pp. 849-857
    • Arpaia, P.1    Daponte, P.2    Michaeli, L.3
  • 95
    • 0141552868 scopus 로고
    • Computer simulation of autocalibration for successive approximation A/D converter
    • Warsaw, Poland, May
    • Michaeli L. Computer simulation of autocalibration for successive approximation A/D converter. 2nd Int. IMEKO TC-4 Symposium, Warsaw, Poland. 1987 (May);125-131.
    • (1987) 2nd Int. IMEKO TC-4 Symposium , pp. 125-131
    • Michaeli, L.1
  • 96
    • 0034833106 scopus 로고    scopus 로고
    • DNL ADC testing by the exponential shaped voltage
    • May
    • Holcer R., Michaeli L. DNL ADC testing by the exponential shaped voltage. Proc. IEEE IMTC 2001. 1:2001 (May);693-697
    • (2001) Proc. IEEE IMTC 2001 , vol.1 , pp. 693-697
    • Holcer, R.1    Michaeli, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.