ADC modeling and testing

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1992-1999

  Chiorboli, G ^a   Morandi, C ^a  

^a UNIVERSITY OF PARMA   (Italy)

Author keywords

Analog to digital converters; Mixed signal test; Modeling

Indexed keywords

ANALOG TO DIGITAL CONVERSION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS;

ANALOG TO DIGITAL CONVERTER; MIXED-SIGNAL TEST;

FREQUENCY DOMAIN ANALYSIS;

EID: 0034835628     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)

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12. Effective bits: Is that all there is?
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15. Histogram measurement of ADC nonlinearities using sine wave
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18. Band separation and the noise power ratio test
19. Error estimates for frequency responses calculated from time-domain measurements
20. A new method for estimating the aperture uncertainty of A/D converters
21. Using sine waves to estimate analog-to-digital converter dynamic error functions
22. Improved error-table compensation of A/D converters
23. Finite memory non-linear model of a S/H-ADC device
24. Black-box identification of digital waveform recorders