Dynamic testing of A/D converters: how many samples for a given precision?

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1996, Pages 1298-1303

  Dallet, Dominique ^a   Valeze, Franck ^a   Kadionik, Patrice ^a   Benkais, Mohammed ^a   Marchegay, Philippe ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; ELECTRIC WAVEFORMS; PERFORMANCE; PROBABILITY; SAMPLING; SIGNAL PROCESSING; STATISTICAL METHODS;

DIFFERENTIAL NONLINEARITY; INTEGRAL NONLINEARITY; SIGNAL RECONSTRUCTION;

ANALOG TO DIGITAL CONVERSION;

EID: 0029723513     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)