DNL ADC testing by the exponential shaped voltage

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2001, Pages 693-697

  Holcer, R ^a   Michaeli, L ^a  

^a TECHNICAL UNIVERSITY OF KO ICE   (Slovakia)

Author keywords

ADC testing; Exponential stimulus; Histogram method

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; MICROCONTROLLERS; NONLINEAR SYSTEMS; PARAMETER ESTIMATION; THERMAL NOISE;

EXPONENTIAL SHAPED VOLTAGE; HISTOGRAM;

DIGITAL SIGNAL PROCESSING;

EID: 0034833106     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. IEEE standard for digitizing waveform recorders
2. IEEE standard for terminology and test methods for analog-to-digital converters
3. Multi-tone testing of quantisers using PRBS signal
4. Suppression of test signal distortion by A/D modules dynamic testing
5. ADC histogram test using small amplitude input waves
6. A fast method for correction of systematic errors of ADC in histogram measurements
7. The performance test of the AD converters embedded on some microcontrollers