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Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 2015-2020

A new bidimensional histogram for the dynamic characterization of ADCs

(4) Acunto, Salvatore a Arpaia, Pasquale a Hummels, Donald b Irons, Fred H b

a UNIVERSITY OF NAPLES FEDERICO II (Italy)

b University of Maine (United States)

Author keywords

ADC testing; Dual tone; Histogram; Phase plane

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; FREQUENCIES; GRAPHIC METHODS; MEASUREMENTS; PROBABILITY DISTRIBUTIONS; SIGNAL PROCESSING; STANDARDIZATION;

ACTUAL TRANSFER CHARACTERISTICS; BIDIMENSIONAL HISTOGRAM; DUAL TONE SIGNAL; PHASE PLANE; SINGLE TONE ACQUISITIONS;

ANALOG TO DIGITAL CONVERSION;

EID: 0034833090 PISSN: 10915281 EISSN: None Source Type: Journal
DOI: 10.1109/IMTC.2001.929552 Document Type: Article

Times cited : (8)

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