Characterization of digitizer timebase jitter by means of the Allan variance

Computer Standards and Interfaces

Volumn 25, Issue 1, 2003, Pages 15-22

  Arpaia, Pasquale ^a   Daponte, Pasquale ^a   Rapuano, Sergio ^a  

^a UNIVERSITY OF SANNIO   (Italy)

Author keywords

Allan variance; Diagnostics; Jitter; Modeling; Testing; Waveform digitizers

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; DIGITAL SIGNAL PROCESSING; MICROPROCESSOR CHIPS; SPURIOUS SIGNAL NOISE; WAVEFORM ANALYSIS;

WAVEFORM DIGITIZERS;

JITTER;

EID: 0037332946     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(02)00074-0     Document Type: Conference Paper

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