Testing and optimizing ADC performance: A probabilistic approach

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 2, 1996, Pages 621-626

  Giaquinto, Nicola ^b   Savino, Mario ^a,b   Trotta, Amerigo ^a,b  

^a IEEE

^b POLITECNICO DI BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; ELECTRONIC EQUIPMENT TESTING; ERRORS; OPTIMIZATION; PERFORMANCE; PROBABILITY; PROBABILITY DENSITY FUNCTION;

CONDITIONAL PROBABILITY FUNCTION; HISTOGRAM TEST;

ANALOG TO DIGITAL CONVERSION;

EID: 0030128149     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.492799     Document Type: Article

References (12)

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