Comparison of time base nonlinearity measurement techniques

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 34-39

  Stenbakken, Gerard N ^a   Deyst, John P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Analytic signal; Digitizer; Distortion; Measurement; Multiphase; Nonlinear; Simulation; Sinefit; Time base

Indexed keywords

CATHODE RAY OSCILLOSCOPES; COMPUTER SIMULATION; DISTORTION (WAVES); ELECTRIC DISTORTION; SPURIOUS SIGNAL NOISE;

DIGITIZERS;

ELECTRIC MEASURING INSTRUMENTS;

EID: 0031988214     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728785     Document Type: Article

References (17)

1. J. R. Andrews, "Pulse measurements in the picosecond domain," Picosecond Pulse Labs Appl. Note AN-3a, p. 2, Oct. 1988.
2. W. R. Scott, Jr., "Error corrections for an automated time-domain network analyzer," IEEE Trans. Instrum. Meas., vol. IM-35, pp. 300-303, Sept. 1986.
3. A. M. Nicholson, "Broad-band microwave transmission characteristics from a single measurement of the transient response," IEEE Trans. Instrum. Meas., vol. IM-17, pp. 395-402, Dec. 1968.
4. W. L. Gans, "Calibration and error analysis of a picosecond pulse waveform measurement system at NBS," Proc. IEEE, vol. 74, pp. 86-90, Jan. 1986.
5. J. B. Rettig and L. Dobos, "Picosecond time interval measurements," IEEE Trans. Instrum. Meas., vol. 44, pp. 284-287, Apr. 1995.
6. "IEEE Standard for Digitizing Waveform Recorders," IEEE Std. 1057-1994, pp. 46-48, Dec. 1994.
7. "IEEE Standard for Digitizing Waveform Recorders," IEEE Std. 1057-1994, pp. 17-28, Dec. 1994.
8. R. Pintelon and J. Schoukens, "An improved sine wave fitting procedure for characterizing data acquisition channels," IEEE Trans. Instrum. Meas., vol. 45, pp. 588-593, Apr. 1996.
9. J. Verspecht, "Accurate spectral estimation based on measurements with a distorted-timebase digitizer," IEEE Trans. Instrum. Meas., vol. 43, pp. 210-215, Apr. 1994.
10. Y.-C. Jenq, "Digital spectra of nonuniformly sampled signals: A robust sampling time offset estimation algorithm for ultra high-speed waveform digitizers using interleaving," IEEE Trans. Instrum. Meas., vol. 39, pp. 71-75, Feb. 1990.
11. A. Papoulis, Probability, Random Variables, and Stochastic Processes. New York: McGraw-Hill, pp. 181, 357.
12. J. Schoukens, R. Pintelon, and G. Vandersteen, "A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter," in IEEE IMTC/96 Conf. Dig., Brussels, Belgium, June 4-6, 1996, pp. 1419-1424.
13. T. M. Souders, B. C. Waltrip, O. B. Laug, and J. P. Deyst, "A wideband sampling voltmeter," in IEEE IMTC/96 Conf. Dig., Brussels, Belgium, June 4-6, 1996, pp. 1139-1144.
14. J. Verspecht, "Calibration of a measurement system for high frequency nonlinear devices," Ph.D. dissertation, Vrije Univ. Brussel, Brussels, Belgium, pp. 38-41, Sept. 1995.
15. C. Gyles, "Repetitive waveform high frequency, high precision digitizer," IEEE Trans. Instrum. Meas., vol. 38, pp. 917-919, Aug. 1989.
16. F. J. Harris, "On the use of windows for harmonic analysis with the discrete Fourier transform," Proc. IEEE, vol. 66, pp. 51-83, Jan. 1978.
17. W. L. Gans, unpublished experimental data and comments, Jijit Metrology, LLC, Feb. 1997.