SCOPUS 정보 검색 플랫폼

Volumn 4999, Issue , 2003, Pages 497-508

Confocal photoluminescence method for measuring the carrier migration in structures with quantum dots

Author keywords

Carrier migration; Confocal microscopy; InAs quantum dots; Migration length

Indexed keywords

CHARGE CARRIERS; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

CARRIER MIGRATION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0141790140 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.485707 Document Type: Conference Paper

Times cited : (2)

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