X-ray photoemission studies of praseodymium thin films on SiO 2/Si(100)

Journal of Physics Condensed Matter

Volumn 15, Issue 34, 2003, Pages 5857-5864

  Wu, J X ^a   Wang, Z M ^a   Ma, M S ^a   Li, S ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MOLECULAR ORIENTATION; PHOTOEMISSION; SILICA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL SHIFTS;

PRASEODYMIUM;

EID: 0141719453     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/34/315     Document Type: Conference Paper

References (17)

1. Schulz M 1999 Nature 399 729
2. Muller D A, Sorsch T, Moccio S, Baumann F H, Evans-Lutterodt K and Timp G 1999 Nature 399 758
3. Kingon AI, Maria J P and Streiffer S K 2000 Nature 406 1032
4. Wilk G D, Wallace R M and Anthony J M 2001 J. Appl. Phys. 89 5243
5. Wilk G D, Wallace R M and Anthony J M 2000 J. Appl. Phys. 87 484
6. Ono H and Katsumata T 2001 Appl. Phys. Lett. 78 1832
7. Liu J P, Zaumseil P, Bugiel E and Osten H J 2001 Appl. Phys. Lett. 79 671
8. Fissel A, Dabrowski J and Osten H J 2002 J. Appl Phys. 90 8986
9. Sayan S, Garfunkel E and Suzer S 2002 Appl. Phys. Lett. 80 2135
10. Liehr M, LeGoues F K, Rubloff G W and Ho P S 1985 J. Vac. Sci. Technol. A 3 983
11. Dadahai F, Gaspari F, Zukotynski S and Bland C 1996 J. Appl. Phys. 80 6505
12. Osten H J, Liu J P, Gaworzewski P, Bugiel E and Zaumseil P 2000 Technical Digest Int. Electron Devices Mtg (Piscataway, NJ: IEEE) p 653
13. Briggs D and Seah M P 1983 Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (Chichester: Wiley)
14. Tabe M, Chiang T T, Lindau I and Spicer W E 1986 Phys. Rev. B 34 2706
15. Iwata S and Ishizaka A 1996 J. Appl. Phys. 79 6653
16. Gunter P L J, de Jong A M, Niemantsverdriet J W and Rheiter H J H 1992 Surf. Interface Anal. 19 161
17. Saito Y, Yamaki K, Fujimori S, Suzuki S and Sato S 1999 J. Electron Spectrosc. Relat. Phenom. 101-103 501