Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 7 B, 2003, Pages 4878-4881

  Satoh, Nobuo ^a   Kobayashi, Kei ^a   Watanabe, Shunji ^b   Fujii, Toru ^b   Horiuchi, Toshihisa ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b NIKON CORPORATION   (Japan)

Author keywords

FM detection; KFM; Piezoelectric cantilever; SNOM

Indexed keywords

COPOLYMERS; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PIEZOELECTRIC MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SINGLE CRYSTALS; THIN FILMS;

DYNAMIC-MODE ATOMIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; FREQUENCY MODULATION DETECTION METHOD; LEAD ZIRCONATE TITANATE; PIEZOELECTRIC CANTILEVER; SCANNING NEAR-FIELD OPTICAL MICROSCOPE;

ATOMIC FORCE MICROSCOPY;

EID: 0141457597     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4878     Document Type: Article

References (25)

1. E. Betzig, P. L. Finn and J. S. Weiner: Appl. Phys. Lett. 60 (1992) 2484.
2. D. W. Pohl and L. Novotny: J. Vac. Sci. & Technol. B 12 (1994) 1441.
3. T. Yatsui, M. Kourogi and M. Ohtsu: Appl. Phys. Lett. 73 (1998) 2090.
4. T. Saiki and K. Matsuda: Appl. Phys. Lett. 74 (1999) 2773.
5. S. Hosaka, T. Shintani, A. Kikukawa and K. Itoh: Appl. Surf. Sci. 140 (1999) 388.
6. K. Nakajima, R. Micheletto, K. Mitsui, T. Isoshima, M. Hara, T. Wada, H. Sasabe and W. Knoll: Jpn. J. Appl. Phys. 38 (1999) 3949.
7. P. N. Minh, T. Ono and M. Esashi: Rev. Sci. Instrum. 71 (2000) 3111.
8. G. T. Shubeita, S. K. Sekatskii, B. Riedo, G. Dietler and U. Dürig: Appl. Phys. Lett. 88 (2000) 2921.
9. Y. Inouye and S. Kawata: Opt. Lett. 19 (1994) 159.
10. A. G. Ruiter, M. H. Moers, N. F. van Hulst and M. de Boer: J. Vac. & Sci. Technol. B 14 (1996) 597.
11. R. Laddada, P.-M. Adam, P. Royer and J. L. Bijeon: Ultramicroscopy 37 (1998) 2142.
12. G. Wurtz, R. Bachelot and P. Royer: Rev. Sci. Instrum. 69 (1998) 1735.
13. A. Naber, H.-J. Maas, K. Razavi and U. C. Fischer: Rev. Sci. Instrum. 70 (1999) 3955.
14. R. Hillenbrand and F. Keilmann: Appl. Phys. Lett. 80 (2002) 25.
15. H. Yamada, H. Itoh, S. Watanabe, K. Kobayashi and K. Matsushige: Surf. Interface Anal. 27 (1999) 503.
16. N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, T. Horiuchi, H. Yamada and K. Matsushige: Appl. Surf. Sci. 188 (2002) 425.
17. N. Satoh, S. Watanabe, T. Fujii, K. Kobayashi, H. Yamada and K. Matsushige: IEICE Trans. Electron. E85-C (2002) 2071.
18. K. Kobayashi, H. Yamada, K. Umeda, T. Horiuchi, S. Watanabe, T. Fujii, S. Hotta and K. Matsushige: Appl. Phys. A 72 (2001) 97.
19. T. R. Albrecht, P. Grütter, D. Horne and D. Rugar: J. Appl. Phys. 69 (1991) 668.
20. T. Fujii, S. Watanabe, M. Suzuki and T. Fujiu: J. Vac. & Sci. Technol. B 13 (1995) 1119.
21. S. Watanabe and T. Fujii: Rev. Sci. Instrum. 67 (1996) 3898.
22. T. Fujii and S. Watanabe: Appl. Phys. Lett. 68 (1996) 467.
23. K. Kobayashi, H. Yamada, H. Itoh, T. Horiuchi and K. Matsushige: Rev. Sci. Instrum. 72 (2001) 4383.
24. H. Okino, T. Ida, H. Ebihara, H. Yamada, K. Matsuhige and T. Yamamoto: Jpn. J. Appl. Phys. 40 (2001) 5828.
25. X. Q. Chen, H. Yamada, Y. Terai, T. Horiuchi, K. Matsushige and P. S. Weiss: Thin Solid Films 353 (1999) 259.