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Volumn 79, Issue 10, 1996, Pages 7814-7819
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Interface properties of metal-oxide-semiconductor structures on n-type 6H and 4H-SiC
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 5544260830
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.362389 Document Type: Article |
Times cited : (46)
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References (16)
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