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Volumn 54, Issue 16, 1996, Pages R11129-R11132
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Thermally induced interface degradation in (111) Si/S traced by electron spin resonance
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000303921
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.R11129 Document Type: Article |
Times cited : (63)
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References (25)
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