SCOPUS 정보 검색 플랫폼

Volumn 398, Issue 399, 2001, Pages 496-500

Characterization of thin film elastic properties using X-ray diffraction and mechanical methods: Application to polycrystalline stainless steel

(9) Goudeau, P a Renault, P O a Villain, P a Coupeau, C a Pelosin, V b Boubeker, B c Badawi, K F a Thiaudieere D d Gailhanou, M d

a UNIVERSITÉ DE POITIERS (France)

b ENSMA (France)

c FACULTÉ DES SCIENCES BEN M SIK (Morocco)

d UNIVERSITÉ PARIS SACLAY (France)

Author keywords

AFM; Buckling; Elastic constants; Tensile testing; Thin films; Vibrating reed; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; ELASTIC MODULI; ION BEAMS; POISSON RATIO; SPUTTER DEPOSITION; STAINLESS STEEL; SUBSTRATES; TENSILE TESTING; X RAY DIFFRACTION ANALYSIS;

BUCKLING GEOMETRY;

THIN FILMS;

EID: 0035509120 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01464-X Document Type: Article

Times cited : (41)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.