Macro stress mapping on thin film buckling

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 709-714

  Goudeau, P ^a   Villain, P ^a   Renault, P O ^a   Tamura, N ^a   Celestre, R S ^a   Padmore, H ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

Delamination; Micro X ray diffraction; Residual stresses; Strain mapping; Thin film

Indexed keywords

BUCKLING; COMPRESSIVE STRESS; DELAMINATION; PHYSICAL VAPOR DEPOSITION; RESIDUAL STRESSES; STRAIN; STRESS ANALYSIS; X RAY DIFFRACTION ANALYSIS;

STRESS MAPPING;

THIN FILMS;

EID: 17144463730     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.709     Document Type: Conference Paper

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