Electrochemical tailoring and optical investigation of advanced refractive index profiles in porous silicon layers

Materials Research Society Symposium - Proceedings

Volumn 557, Issue , 1999, Pages 195-200

  Zangooie, S ^a   Jansson, R ^a   Arwin, H ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CRYSTALLINE MATERIALS; CURRENT DENSITY; ELECTROCHEMISTRY; ELLIPSOMETRY; MATHEMATICAL MODELS; OPTICAL MULTILAYERS; POROSITY; REFRACTIVE INDEX;

BRUGGEMAN EFFECTIVE MEDIUM APPROXIMATION; CRYSTALLINE SILICON; SPECTROSCOPIC ELLIPSOMETRY;

POROUS SILICON;

EID: 0033298934     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-557-195     Document Type: Article

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