X-ray diffraction investigation of porous silicon superlattices

Thin Solid Films

Volumn 276, Issue 1-2, 1996, Pages 69-72

  Buttard, D ^a   Bellet, D ^a   Baumbach, T ^b  

^a UNIV GRENOBLE ALPES   (France)

^b INSTITUT LAUE LANGEVIN   (France)

Author keywords

Silicon; Structural properties; Superlattices; X ray diffraction

Indexed keywords

HETEROJUNCTIONS; SUPERLATTICES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

SILICON HETEROSTRUCTURE;

POROUS SILICON;

EID: 0030120576     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08048-1     Document Type: Article

References (14)

1. J.C. Vial, L.T. Canham and W. Lang (ed.), Light Emission from Silicon, Proc. E-MRS Spring Conference, North Holland, Amsterdam, 1993.
2. L.T. Canham, Appl. Phys. Lett., 57 (1990) 1046.
3. A. Halimaoui, C. Oules, G. Bomchil, A. Bsiesy, F. Gaspard, R. Herino, M. Ligeon and F. Muller, Appl. Phys. Lett., 59 (1991) 304.
4. N. Koshida and H. Koyama, Appl. Phys. Lett., 60 (1991) 347.
5. R. Herino, G. Bomchil, K. Barla, C. Bertrand and J.L. Ginoux, J. Electrochem. Soc., 134 (1987) 1994.
6. R.L. Smith and S.D. Collins, J. Appl. Phys., 71 (8) (1992) R1.
7. G. Vincent, Appl. Phys. Lett., 64 (1994) 2367.
8. M.G. Berger, C. Dieker, M. Thönissen, L. Vescan, H. Lüth, H. Münder, W. Theiß, M. Wernke and P. Grosse, J. Phys. D: Appl. Phys., 27 (1994) 1333.
9. K. Barla, G. Bomchil, R. Hérino, J.C. Pfister and J. Baruchel, J. Cryst. Growth, 68 (1984) 721.
10. K. Barla, R. Herino, G. Bomchil, J.C. Pfister and A. Freund, J. Cryst. Growth, 68 (1984) 727.
11. D. Bellet, G. Dolino, M. Ligeon, P. Blanc and M. Krisch, J. Appl. Phys., 71 (1992) 145.
12. A.A. Lomov, D. Bellet and G. Dolino, Phys. Stat. Sol. (b) 190 (1995) 219.
13. W.J. Bartels, J. Hornstra and D.J.W. Lobeek, Acta Crystallogr., A42 (1986) 539.
14. T. Baumbach, H.-G. Brühl, H. Rhan and U. Pietsch, J. Appl. Crystallogr., 21 (1988) 386.