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Volumn 20, Issue 4, 2002, Pages 1677-1681
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Scanning tunneling potentiometry of semiconductor junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
ELECTROSTATICS;
FERMI LEVEL;
INTERFACES (MATERIALS);
POTENTIOMETERS (RESISTORS);
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
CONSTANT TUNNEL CURRENT;
ELECTROSTATIC POTENTIAL DISTRIBUTION;
SCANNING TUNNELING POTENTIOMETRY;
HETEROJUNCTIONS;
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EID: 0035982603
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1491535 Document Type: Conference Paper |
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Times cited : (23)
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References (18)
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