Imaging the depletion zone in a Si lateral pn junction with scanning tunneling microscopy

Applied Physics Letters

Volumn 72, Issue 25, 1998, Pages 3314-3316

  Hildner, M L ^a,b   Phaneuf, R J ^a,b   Williams, E D ^b  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b University of Maryland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001600053     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121635     Document Type: Article

References (19)

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