Contribution of surface resonances to scanning tunneling microscopy images: (110) surfaces of III-V semiconductors

Physical Review Letters

Volumn 77, Issue 14, 1996, Pages 2997-3000

  Ebert, Ph ^a   Engels, B ^a   Richard, P ^a   Schroeder, K ^a   Blugel S ^a   Domke, C ^a   Heinrich, M ^a   Urban, K ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHEMICAL BONDS; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; IMAGE QUALITY; MORPHOLOGY; RESONANCE; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; SURFACES;

ATOMIC CORRUGATION; BIAS VOLTAGES; DANGLING BONDS; GALLIUM PHOSPHIDE;

SCANNING TUNNELING MICROSCOPY;

EID: 6144254357     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.2997     Document Type: Article

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