Intermittent contact AFM using the higher modes of weak cantilever

Ultramicroscopy

Volumn 86, Issue 1-2, 2001, Pages 217-222

  Ulcinas, Arturas ^a   Snitka, Valentinas ^a  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

Author keywords

Atomic force microscopy instruments; Atomic force microscopy surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER; CONFERENCE PAPER; DEVICE; DYNAMICS; INSTRUMENT; SURFACE PROPERTY; TECHNIQUE; THEORY; VIBRATION;

EID: 0035137095     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00084-X     Document Type: Conference Paper

References (17)