-
1
-
-
0014617767
-
Extension of laser harmonic-frequency mixing techniques into the 9 μ region with an infrared metal-metal point-contact diode
-
Daneu, V., Sokoloff, D., Sanchez, A. and Javan, A.: Extension of Laser Harmonic-Frequency Mixing Techniques into the 9 μ Region with an Infrared Metal-Metal Point-Contact Diode, Appl. Phys. Lett. 15 (1969), 398-401.
-
(1969)
Appl. Phys. Lett.
, vol.15
, pp. 398-401
-
-
Daneu, V.1
Sokoloff, D.2
Sanchez, A.3
Javan, A.4
-
2
-
-
0014824727
-
Improved coupling to infrared whisker diodes by use of antenna theory
-
Matarrese, L.M. and Evenson, K.M.: Improved Coupling to Infrared Whisker Diodes by Use of Antenna Theory, Appl. Phys. Lett. 17 (1970), 8-10.
-
(1970)
Appl. Phys. Lett.
, vol.17
, pp. 8-10
-
-
Matarrese, L.M.1
Evenson, K.M.2
-
3
-
-
0018026876
-
The MOM tunneling diode: Theoretical estimate of its performance at microwave and infrared frequencies
-
Sanchez, A., Davis, C.F., Liu, K.C. and Javan, A.: The MOM Tunneling Diode: Theoretical Estimate of its Performance at Microwave and Infrared Frequencies, J. Appl. Phys. 49 (1978), 5270-5277.
-
(1978)
J. Appl. Phys.
, vol.49
, pp. 5270-5277
-
-
Sanchez, A.1
Davis, C.F.2
Liu, K.C.3
Javan, A.4
-
4
-
-
0037521559
-
Noncontact technique for the local measurement of semiconductor resistivity
-
Bryant, C.A. and Gunn, J.B.: Noncontact Technique for the Local Measurement of Semiconductor Resistivity, Rev. Sci. Instr. 36 (1965), 1614-1617.
-
(1965)
Rev. Sci. Instr.
, vol.36
, pp. 1614-1617
-
-
Bryant, C.A.1
Gunn, J.B.2
-
5
-
-
0019054932
-
Coaxial line rreflection methods for measuring dielectric properties of biological substances at radio and microwave frequencies
-
Stuchly, M.A. and Stuchly, S.S.: Coaxial Line Rreflection Methods for Measuring Dielectric Properties of Biological Substances at Radio and Microwave Frequencies, Trans. Instr. Meas. 31 (1980), 176-183.
-
(1980)
Trans. Instr. Meas.
, vol.31
, pp. 176-183
-
-
Stuchly, M.A.1
Stuchly, S.S.2
-
6
-
-
0037992740
-
-
U.S. Patent 4,994,818 (1988)
-
Keilmann, F.: U.S. Patent 4,994,818 (1988).
-
-
-
Keilmann, F.1
-
7
-
-
0024303967
-
Scanning electromagnetic transmission line microscope with sub-wavelength resolution
-
Fee, M., Chu, S. and Hänsch, T.W.: Scanning Electromagnetic Transmission Line Microscope with Sub-Wavelength Resolution, Optics Commun. 69 (1989), 219-224.
-
(1989)
Optics Commun.
, vol.69
, pp. 219-224
-
-
Fee, M.1
Chu, S.2
Hänsch, T.W.3
-
8
-
-
0028433841
-
The scanning dielectric microscope
-
Asami, K.: The Scanning Dielectric Microscope, Meas. Sci. Technol. 5 (1994), 589-592.
-
(1994)
Meas. Sci. Technol.
, vol.5
, pp. 589-592
-
-
Asami, K.1
-
9
-
-
0030211696
-
Extreme sub-wavelength resolution with a scanning radio-frequency transmission microscope
-
Keilmann, F., Weide, D.W. v.d., Eickelkamp, T., Merz, R. and Stöckle, D.: Extreme Sub-Wavelength Resolution with a Scanning Radio-Frequency Transmission Microscope, Optics Commun. 129 (1996), 15-18.
-
(1996)
Optics Commun.
, vol.129
, pp. 15-18
-
-
Keilmann, F.1
Weide, D.W.V.D.2
Eickelkamp, T.3
Merz, R.4
Stöckle, D.5
-
10
-
-
0001191013
-
Contrast of microwave near-field microscopy
-
Knoll, B., Keilmann, F., Kramer, A. and Guckenberger, R.: Contrast of Microwave Near-Field Microscopy, Appl. Phys. Lett. 70 (1997), 2667-2669.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2667-2669
-
-
Knoll, B.1
Keilmann, F.2
Kramer, A.3
Guckenberger, R.4
-
11
-
-
0000236698
-
Scanning nonlinear dielectric microscope
-
Cho, Y., Kirihana, A. and Saeki, T.: Scanning Nonlinear Dielectric Microscope, Rev. Sci. Instr. 67 (1996), 2297-2303.
-
(1996)
Rev. Sci. Instr.
, vol.67
, pp. 2297-2303
-
-
Cho, Y.1
Kirihana, A.2
Saeki, T.3
-
12
-
-
0001486181
-
Scanning tip microwave near-field microscope
-
Wei, T., Xiang, X.D., Wallace-Freedman, W.G. and Schultz, P.G.: Scanning Tip Microwave Near-Field Microscope, Appl. Phys. Lett. 68 (1996), 3506-3508.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 3506-3508
-
-
Wei, T.1
Xiang, X.D.2
Wallace-Freedman, W.G.3
Schultz, P.G.4
-
13
-
-
0000738890
-
Near-field scanning microwave microscope with 100 μm resolution
-
Vlahacos, C.P., Black, R.C., Anlage, S.M., Amar, A. and Wellstood, F.C.: Near-Field Scanning Microwave Microscope with 100 μm Resolution, Appl. Phys. Lett. 69 (1996), 3272-3274.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 3272-3274
-
-
Vlahacos, C.P.1
Black, R.C.2
Anlage, S.M.3
Amar, A.4
Wellstood, F.C.5
-
14
-
-
0008679327
-
-
Kluwer, Amsterdam
-
Anlage, S.M., Steinhauer, D.E., Feenstra, B.J., Vlahacos, C.P. and Wellstood, F.C.: In: H. Weinstock, H. and M. Nisenoff (eds.), Microwave Superconductivity, Kluwer, Amsterdam, 2001, 239-269.
-
(2001)
Microwave Superconductivity
, pp. 239-269
-
-
Anlage, S.M.1
Steinhauer, D.E.2
Feenstra, B.J.3
Vlahacos, C.P.4
Wellstood, F.C.5
In, H.6
Weinstock, H.7
Nisenoff, M.8
-
15
-
-
0036564111
-
Near-field antennas integrated with scanning probes for THz to visible microscopy: Scale modelling and limitations on performance
-
Rosner, B., Peck, J. and Weide, D. v.d.: Near-Field Antennas Integrated with Scanning Probes for THz to Visible Microscopy: Scale Modelling and Limitations on Performance, IEEE Transactions on Antennas and Propagation 50 (2002), 670-675.
-
(2002)
IEEE Transactions on Antennas and Propagation
, vol.50
, pp. 670-675
-
-
Rosner, B.1
Peck, J.2
Weide, D.V.D.3
-
16
-
-
79956020917
-
Electro-optic detection of subwavelength terahertz spot sizes in the near field of a metal tip
-
Valk, N.C.J. v.d. and Planken, P.C.M.: Electro-Optic Detection of Subwavelength Terahertz Spot Sizes in the Near Field of a Metal Tip, Appl. Phys. Lett. 81 (2002), 1558-1560.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 1558-1560
-
-
Valk, N.C.J.V.D.1
Planken, P.C.M.2
-
17
-
-
12044254524
-
Laser-driven scanning tunneling microscope
-
Völcker, M., Krieger, W. and Walther, H.: Laser-Driven Scanning Tunneling Microscope, Phys. Rev. Lett. 66 (1991), 1717-1720.
-
(1991)
Phys. Rev. Lett.
, vol.66
, pp. 1717-1720
-
-
Völcker, M.1
Krieger, W.2
Walther, H.3
-
18
-
-
0037654911
-
Detection of local conductivity by laser-frequency mixing in a scanning force microscope
-
Völcker, M., Krieger, W. and Walther, H.: Detection of Local Conductivity by Laser-Frequency Mixing in a Scanning Force Microscope, J. Appl. Phys. 74 (1993), 5426-5431.
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 5426-5431
-
-
Völcker, M.1
Krieger, W.2
Walther, H.3
-
19
-
-
0001040403
-
Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600
-
Lahrech, A., Bachelot, R., Gleyzes, P. and Boccara, A.C.: Infrared-Reflection-Mode Near-Field Microscopy using an Apertureless Probe with a Resolution of λ/600, Optics Lett. 2 (1996), 1315-1317.
-
(1996)
Optics Lett.
, vol.2
, pp. 1315-1317
-
-
Lahrech, A.1
Bachelot, R.2
Gleyzes, P.3
Boccara, A.C.4
-
21
-
-
0031552789
-
Infrared near-field imaging of implanted semiconductors: Evidence of a pure dielectric contrast
-
Lahrech, A., Bachelot, R., Gleyzes, P. and Boccara, A.C.: Infrared Near-Field Imaging of Implanted Semiconductors: Evidence of a Pure Dielectric Contrast, Appl. Phys. Lett. 71 (1997), 575-577.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 575-577
-
-
Lahrech, A.1
Bachelot, R.2
Gleyzes, P.3
Boccara, A.C.4
-
22
-
-
0032075127
-
Scanning microscopy by mid-infrared near-field scattering
-
Knoll, B. and Keilmann, F.: Scanning Microscopy by Mid-Infrared Near-Field Scattering, Appl. Phys. A 66 (1998), 477-481.
-
(1998)
Appl. Phys. A
, vol.66
, pp. 477-481
-
-
Knoll, B.1
Keilmann, F.2
-
23
-
-
0033551356
-
Near-field probing of vibrational absorption for chemical microscopy
-
Knoll, B. and Keilmann, F.: Near-Field Probing of Vibrational Absorption for Chemical Microscopy, Nature 399 (1999), 134-137.
-
(1999)
Nature
, vol.399
, pp. 134-137
-
-
Knoll, B.1
Keilmann, F.2
-
24
-
-
0033242258
-
Long-wave-infrared near-field microscopy
-
Keilmann, F., Knoll, B. and Kramer, A.: Long-Wave-Infrared Near-Field Microscopy, Physica Status Solidi (b) 215 (1999), 849-854.
-
(1999)
Physica Status Solidi (b)
, vol.215
, pp. 849-854
-
-
Keilmann, F.1
Knoll, B.2
Kramer, A.3
-
25
-
-
0032987669
-
Mid-infrared scanning near-field optical microscope resolves 30 nm
-
Knoll, B. and Keilmann, F.: Mid-infrared Scanning Near-Field Optical Microscope resolves 30 nm, J. Micr. 194 (1999), 512-515.
-
(1999)
J. Micr.
, vol.194
, pp. 512-515
-
-
Knoll, B.1
Keilmann, F.2
-
26
-
-
0034245828
-
Enhanced dielectric contrast in scattering-type scanning nearfield optical microscopy
-
Knoll, B. and Keilmann, F.: Enhanced Dielectric Contrast in Scattering-Type Scanning NearField Optical Microscopy, Optics Commun. 182 (2000), 321-328.
-
(2000)
Optics Commun.
, vol.182
, pp. 321-328
-
-
Knoll, B.1
Keilmann, F.2
-
27
-
-
0000037879
-
Infrared conductivity mapping for nanoelectronics
-
Knoll, B. and Keilmann, F.: Infrared Conductivity Mapping for Nanoelectronics, Appl. Phys. Lett. 77 (2000), 3980-3982.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3980-3982
-
-
Knoll, B.1
Keilmann, F.2
-
28
-
-
0035061904
-
Pure optical contrast in scattering-type scanning near-field optical microscopy
-
Hillenbrand, R., Knoll, B. and Keilmann, F.: Pure Optical Contrast in Scattering-Type Scanning Near-Field Optical Microscopy, J. Micr. 202 (2001), 77-83.
-
(2001)
J. Micr.
, vol.202
, pp. 77-83
-
-
Hillenbrand, R.1
Knoll, B.2
Keilmann, F.3
-
29
-
-
0037062964
-
Phonon-enhanced light-matter interaction at the nanometer scale
-
Hillenbrand, R., Taubner, T. and Keilmann, F.: Phonon-Enhanced Light-Matter Interaction at the Nanometer Scale, Nature 418 (2002), 159-162.
-
(2002)
Nature
, vol.418
, pp. 159-162
-
-
Hillenbrand, R.1
Taubner, T.2
Keilmann, F.3
-
31
-
-
18844482082
-
Complex optical constants on a subwavelength scale
-
Hillenbrand, R. and Keilmann, F.: Complex Optical Constants on a Subwavelength Scale, Phys. Rev. Lett. 85 (2000), 3029-3032.
-
(2000)
Phys. Rev. Lett.
, vol.85
, pp. 3029-3032
-
-
Hillenbrand, R.1
Keilmann, F.2
-
32
-
-
79957940127
-
Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by back-scattering near-field optical microscopy
-
Hillenbrand, R. and Keilmann, F.: Material-Specific Mapping of Metal/Semiconductor/Dielectric Nanosystems at 10 nm Resolution by Back-Scattering Near-Field Optical Microscopy, Appl. Phys. Lett. 80 (2002), 25.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 25
-
-
Hillenbrand, R.1
Keilmann, F.2
-
33
-
-
0034759772
-
Optical oscillation modes of plasmon particles observed in direct space by phase-contrast near-field microscopy
-
Hillenbrand, R. and Keilmann, F.: Optical Oscillation Modes of Plasmon Particles Observed in Direct Space by Phase-Contrast Near-Field Microscopy, Appl. Phys. B 73 (2001), 239-243.
-
(2001)
Appl. Phys. B
, vol.73
, pp. 239-243
-
-
Hillenbrand, R.1
Keilmann, F.2
-
34
-
-
0028515488
-
Apertureless near-field optical microscope
-
Zenhausern, F., O'Boyle, M.P. and Wickramasinghe, H.K.: Apertureless Near-Field Optical Microscope, Appl. Phys. Lett. 65 (1994), 1623-1625.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1623-1625
-
-
Zenhausern, F.1
O'Boyle, M.P.2
Wickramasinghe, H.K.3
-
35
-
-
1542396457
-
Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution
-
Zenhausern, F., Martin, Y. and Wickramasinghe, H.K.: Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution, Science 269 (1995), 1083-1085.
-
(1995)
Science
, vol.269
, pp. 1083-1085
-
-
Zenhausern, F.1
Martin, Y.2
Wickramasinghe, H.K.3
-
36
-
-
0030130158
-
Scattering spectroscopy of molecules at nanometer resolution
-
Martin, Y., Zenhausern, F. and Wickramasinghe, H.K.: Scattering Spectroscopy of Molecules at Nanometer Resolution, Appl. Phys. Lett. 68 (1996), 2475-2477.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2475-2477
-
-
Martin, Y.1
Zenhausern, F.2
Wickramasinghe, H.K.3
-
37
-
-
0000799762
-
The effects of the interaction between resonances in the electromagnetic response of a sphere-plane structure; applications to surface enhanced spectroscopy
-
Aravind, P.K. and Metiu, H.: The Effects of the Interaction between Resonances in the Electromagnetic Response of a Sphere-Plane Structure; Applications to Surface Enhanced Spectroscopy, Surface Sci. 124 (1983), 506-528.
-
(1983)
Surface Sci.
, vol.124
, pp. 506-528
-
-
Aravind, P.K.1
Metiu, H.2
-
38
-
-
0035870627
-
Polarization resolution in apertureless near-field microscopy
-
Larsen, R.E. and Metiu, H.: Resolution and Polarization in Apertureless Near-Field Microscopy, J. Chem. Phys. 114 (2001), 6851-6860.
-
(2001)
J. Chem. Phys.
, vol.114
, pp. 6851-6860
-
-
Larsen, R.E.1
Metiu, H.2
-
39
-
-
0001691319
-
Theory of electromagnetic field imaging and spectroscopy in scanning near-field optical microscopy
-
Porto, J.A., Carminati, R. and Greffet, J.J.: Theory of Electromagnetic Field Imaging and Spectroscopy in Scanning Near-Field Optical Microscopy, J. Appl. Phys. 88 (2000), 4845-4850.
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 4845-4850
-
-
Porto, J.A.1
Carminati, R.2
Greffet, J.J.3
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