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Volumn 21, Issue 3, 2003, Pages 797-805

X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr-V low activation temperature nonevaporable getter films

Author keywords

[No Author keywords available]

Indexed keywords

CARBIDES; CARBON; CHEMICAL ACTIVATION; ELECTRON ENERGY LOSS SPECTROSCOPY; HYDROGEN; MOLECULAR BEAMS; SECONDARY ION MASS SPECTROMETRY; STAINLESS STEEL; STOICHIOMETRY; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037665288     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1562175     Document Type: Article
Times cited : (29)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.