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Volumn 21, Issue 3, 2003, Pages 797-805
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X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr-V low activation temperature nonevaporable getter films
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBIDES;
CARBON;
CHEMICAL ACTIVATION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
HYDROGEN;
MOLECULAR BEAMS;
SECONDARY ION MASS SPECTROMETRY;
STAINLESS STEEL;
STOICHIOMETRY;
SUBSTRATES;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
HYDRIDE GROUP;
HYDROXYL GROUP;
OXIDE STOICHIOMETRY;
STATIC SECONDARY ION MASS SPECTROSCOPY;
SUPERFICIAL OXIDE LAYER;
THERMAL ACTIVATION;
ZIRCONIUM-VANADIUM ALLOY;
ZIRCONIUM ALLOYS;
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EID: 0037665288
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1562175 Document Type: Article |
Times cited : (29)
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References (38)
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