Using neutral atoms and standing light waves to form a calibration artifact for length metrology

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 6, 1998, Pages 3841-3845

  Thywissen, J H ^a   Johnson, K S ^a   Dekker, N H ^a   Chu, A P ^a   Prentiss, M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037555026     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590420     Document Type: Article

References (27)

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